Inventor · disambiguated record
Umesh Chandra Srivastava
Also filed as: SRIVASTAVA UMESH CHANDRA
4 granted patents·8 citations·filing 2022–2023
62Inventor score
Technology areasG01R
Files withST MICROELECTRONICS INT NV4
Top patents by PatentIndex Score
4 records- 0193US11714131B1Circuit and method for scan testingST MICROELECTRONICS INT NV·Filed 2022·Granted Aug 1, 2023·7 cites·20 claims
- 0286US12146911B1TVF transition coverage with self-test and production-test time reductionST MICROELECTRONICS INT NV·Filed 2023·Granted Nov 19, 2024·1 cites·20 claims
- 0367US12366605B2Area, cost, and time-effective scan coverage improvementST MICROELECTRONICS INT NV·Filed 2023·Granted Jul 22, 2025·0 cites·20 claims
- 0465US12345764B2Test pattern generation using multiple scan enablesST MICROELECTRONICS INT NV·Filed 2023·Granted Jul 1, 2025·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →