Inventor · disambiguated record

Umenori Sugiyama

Also filed as: SUGIYAMA UMENORI

2 granted patents·4 citations·filing 2008–2010

45Inventor score

Technology areasG01R

Files withNIHON MICRONICS KK1 WASHIO KENICHI1

Top patents by PatentIndex Score

2 records

0154US8471586B2Wafer prober for semiconductor inspection and inspection methodWASHIO KENICHI·Filed 2010·Granted Jun 25, 2013·1 cites·10 claims
0254US7719300B2Method for testing a semiconductor wafer and apparatus thereofNIHON MICRONICS KK·Filed 2008·Granted May 18, 2010·3 cites·7 claims

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