Inventor · disambiguated record
Van-Hung Pham
Also filed as: PHAM VAN · PHAM VAN H · PHAM VAN-HUNG
8 granted patents·119 citations·filing 1994–2009
87Inventor score
Top patents by PatentIndex Score
8 records- 0172US6329831B1Method and apparatus for reliability testing of integrated circuit structures and devicesADVANCED MICRO DEVICES INC·Filed 1997·Granted Dec 11, 2001·42 cites·21 claims
- 0263US8022716B2Dielectric breakdown lifetime enhancement using alternating current (AC) capacitanceGLOBALFOUNDRIES INC·Filed 2009·Granted Sep 20, 2011·4 cites·19 claims
- 0363US6770847B2Method and system for Joule heating characterizationADVANCED MICRO DEVICES INC·Filed 2002·Granted Aug 3, 2004·10 cites·20 claims
- 0461US6075293ASemiconductor device having a multi-layer metal interconnect structureADVANCED MICRO DEVICES INC·Filed 1999·Granted Jun 13, 2000·26 cites·20 claims
- 0557US5786705AMethod for evaluating the effect of a barrier layer on electromigration for plug and non-plug interconnect systemsADVANCED MICRO DEVICES INC·Filed 1996·Granted Jul 28, 1998·18 cites·11 claims
- 0647US5612627AMethod for evaluating the effect of a barrier layer on electromigration for plug and non-plug interconnect systemsADVANCED MICRO DEVICES INC·Filed 1994·Granted Mar 18, 1997·10 cites·36 claims
- 0741US6100101ASensitive technique for metal-void detectionADVANCED MICRO DEVICES INC·Filed 1998·Granted Aug 8, 2000·9 cites·18 claims
- 0835US8501504B2Method and system for non-destructive determination of dielectric breakdown voltage in a semiconductor waferYIANG KOK YONG·Filed 2008·Granted Aug 6, 2013·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →