Inventor · disambiguated record
Valts Treibergs
Also filed as: TREIBERGS VALTS · TREIBERGS VALTS E · TREIBERGS VALTS EDGARS
22 granted patents·1 pending application·294 citations·filing 1997–2024
95Inventor score
Top patents by PatentIndex Score
23 records- 0197US7256593B2Electrical contact probe with compliant internal interconnectCAPITAL FORMATION INC·Filed 2006·Granted Aug 14, 2007·97 cites·17 claims
- 0292US11906576B1Contact assembly array and testing system having contact assembly arrayJOHNSTECH INT CORP·Filed 2022·Granted Feb 20, 2024·2 cites·20 claims
- 0392US7862391B2Spring contact assemblyCAPITAL FORMATION INC·Filed 2008·Granted Jan 4, 2011·38 cites·18 claims
- 0491US10037933B2Test socket assembly and related methodsXCERRA CORP·Filed 2015·Granted Jul 31, 2018·8 cites·22 claims
- 0586US8523579B2Spring contact assemblyJOHNSTON CHARLES J·Filed 2012·Granted Sep 3, 2013·19 cites·9 claims
- 0685US11867752B1Contact assembly and kelvin testing system having contact assemblyJOHNSTECH INT CORP·Filed 2022·Granted Jan 9, 2024·1 cites·16 claims
- 0783US9829506B2Test probe assembly and related methodsXCERRA CORP·Filed 2013·Granted Nov 28, 2017·7 cites·22 claims
- 0881US8231416B2Spring contact assemblyJOHNSTON CHARLES J·Filed 2010·Granted Jul 31, 2012·11 cites·14 claims
- 0979US11821943B2Compliant ground block and testing system having compliant ground blockJOHNSTECH INT CORP·Filed 2021·Granted Nov 21, 2023·1 cites·20 claims
- 1077US6217341B1Integrated circuit test socket having torsion wire contactsWELLS CTI INC·Filed 1999·Granted Apr 17, 2001·41 cites·28 claims
- 1174US11268981B2Spring-loaded probe having folded portions and probe assemblyXCERRA CORP·Filed 2017·Granted Mar 8, 2022·2 cites·30 claims
- 1271US7173442B2Integrated printed circuit board and test contactor for high speed semiconductor testingCAPITAL FORMATION INC·Filed 2004·Granted Feb 6, 2007·16 cites·7 claims
- 1364USD1015282SSpring pin tipJOHNSTECH INT CORP·Filed 2022·Granted Feb 20, 2024·2 cites·1 claims
- 1463USD1090440SSpring probe contact assemblyJOHNSTECH INT CORP·Filed 2023·Granted Aug 26, 2025·1 cites·1 claims
- 1561US6045370ATest socket for electronic moduleWELLS CTI INC·Filed 1997·Granted Apr 4, 2000·25 cites·14 claims
- 1658US2024241153A1Spring probe contact assemblyJOHNSTECH INT CORP·Filed 2024·Application pending·0 cites
- 1751US11088051B2Test socket assembly and related methodsXCERRA CORP·Filed 2017·Granted Aug 10, 2021·0 cites·22 claims
- 1851US11041881B2Hybrid probe head assembly for testing a wafer device under testXCERRA CORP·Filed 2019·Granted Jun 22, 2021·0 cites·19 claims
- 1949US5990693ATest contactorWELLS CTI·Filed 1997·Granted Nov 23, 1999·17 cites·15 claims
- 2047USD1074619SSpring pin tipJOHNSTECH INT CORP·Filed 2023·Granted May 13, 2025·0 cites·1 claims
- 2143USD1044751SCompliant ground block and testing system for testing integrated circuitsJOHNSTECH INT CORP·Filed 2021·Granted Oct 1, 2024·1 cites·1 claims
- 2233US10101360B2Link socket sliding mount with preloadXCERRA CORP·Filed 2016·Granted Oct 16, 2018·0 cites·4 claims
- 2333US6162080ASocket for positioning and installing an integrated circuit on a circuit boardWELLS CTI·Filed 1999·Granted Dec 19, 2000·5 cites·26 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →