Inventor · disambiguated record
Venkatakaushik Voleti
Also filed as: VOLETI VENKATAKAUSHIK
7 granted patents·5 pending applications·13 citations·filing 2017–2024
75Inventor score
Top patents by PatentIndex Score
12 records- 0189US10955652B2Three-dimensional imaging using swept, confocally aligned planar excitation with a Powell lens and/or deliberate misalignmentUNIV COLUMBIA·Filed 2017·Granted Mar 23, 2021·10 cites·7 claims
- 0276US10908088B2SCAPE microscopy with phase modulating element and image reconstructionUNIV COLUMBIA·Filed 2017·Granted Feb 2, 2021·3 cites·20 claims
- 0376US2025125171A1Spatial pattern loading measurement with imaging metrologyAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 0473US2025076216A1Method and apparatus for detecting defects in a packageAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 0572US2025076212A1Multidirectional illumination for hybrid bonding defect detectionAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 0666US12222659B2Metrology system for packaging applicationsAPPLIED MATERIALS INC·Filed 2023·Granted Feb 11, 2025·0 cites·21 claims
- 0764US12211717B2Spatial pattern loading measurement with imaging metrologyAPPLIED MATERIALS INC·Filed 2021·Granted Jan 28, 2025·0 cites·20 claims
- 0860US11333874B2Three-dimensional imaging using swept, confocally aligned planar excitation with a Powell lens and/or deliberate misalignmentUNIV COLUMBIA·Filed 2021·Granted May 17, 2022·0 cites·7 claims
- 0957US12394655B2Subsurface alignment metrology system for packaging applicationsAPPLIED MATERIALS INC·Filed 2022·Granted Aug 19, 2025·0 cites·20 claims
- 1057US2025012560A1Sample thickness metrology using focused beam interferenceAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 1155US2025062145A1Large Format Continuous Imaging SystemAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 1248US11908716B2Image-based in-situ process monitoringAPPLIED MATERIALS INC·Filed 2021·Granted Feb 20, 2024·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →