Inventor · disambiguated record
Vijay Reddy
Also filed as: REDDY VIJAY · REDDY VIJAY K · REDDY VIJAY KUMAR
26 granted patents·6 pending applications·306 citations·filing 2002–2024
96Inventor score
Files withTEXAS INSTRUMENTS INC22UNIV CENTRAL FLORIDA RES FOUND INC5RALLIS INDIA LTD2REDDY VIJAY KUMAR2TAXAS INSTR INCORPORTED1
Top patents by PatentIndex Score
32 records- 0195US9714966B2Circuit aging sensorTEXAS INSTRUMENTS INC·Filed 2013·Granted Jul 25, 2017·31 cites·20 claims
- 0292US9623082B2Methods and compositions for natural killer cellsUNIV CENTRAL FLORIDA RES FOUND INC·Filed 2013·Granted Apr 18, 2017·18 cites·19 claims
- 0392US6815970B2Method for measuring NBTI degradation effects on integrated circuitsTEXAS INSTRUMENTS INC·Filed 2002·Granted Nov 9, 2004·60 cites·15 claims
- 0489US8138829B2Segmented power amplifier with varying segment activationREDDY VIJAY KUMAR·Filed 2010·Granted Mar 20, 2012·19 cites·16 claims
- 0588US9110111B1Methods and systems to determine a final value of random telegraph noise time constant and magnitudeTEXAS INSTRUMENTS INC·Filed 2014·Granted Aug 18, 2015·15 cites·19 claims
- 0687US10463715B2Methods and compositions for natural killer cellsUNIV CENTRAL FLORIDA RES FOUND INC·Filed 2017·Granted Nov 5, 2019·5 cites·43 claims
- 0787US8753941B1High performance asymmetric cascoded transistorTEXAS INSTRUMENTS INC·Filed 2013·Granted Jun 17, 2014·12 cites·31 claims
- 0886US6933731B2Method and system for determining transistor degradation mechanismsTEXAS INSTRUMENTS INC·Filed 2003·Granted Aug 23, 2005·34 cites·20 claims
- 0985US9778313B2Devices under testTEXAS INSTRUMENTS INC·Filed 2014·Granted Oct 3, 2017·6 cites·17 claims
- 1083US12280094B2Methods and compositions for natural killer cellsUNIV CENTRAL FLORIDA RES FOUND INC·Filed 2023·Granted Apr 22, 2025·0 cites·10 claims
- 1183US7218132B2System and method for accurate negative bias temperature instability characterizationTEXAS INSTRUMENTS INC·Filed 2005·Granted May 15, 2007·12 cites·12 claims
- 1282US9035706B2Variability and aging sensor for integrated circuitsTEXAS INSTRUMENTS INC·Filed 2014·Granted May 19, 2015·6 cites·17 claims
- 1380US7385383B2Methods and systems for determining efficacy of stress protection circuitryTEXAS INSTRUMENTS INC·Filed 2005·Granted Jun 10, 2008·8 cites·20 claims
- 1476US11617781B2Methods and compositions for natural killer cellsUNIV CENTRAL FLORIDA RES FOUND INC·Filed 2019·Granted Apr 4, 2023·0 cites·13 claims
- 1575US7212023B2System and method for accurate negative bias temperature instability characterizationTEXAS INSTRUMENTS INC·Filed 2004·Granted May 1, 2007·17 cites·8 claims
- 1672US10874715B2Methods and compositions for natural killer cellsUNIV CENTRAL FLORIDA RES FOUND INC·Filed 2018·Granted Dec 29, 2020·0 cites·19 claims
- 1772US7952378B2Tunable stress technique for reliability degradation measurementTEXAS INSTRUMENTS INC·Filed 2009·Granted May 31, 2011·6 cites·15 claims
- 1871US2024413239A1Ldmos nanosheet transistorTEXAS INSTRUMENTS INC·Filed 2023·Application pending·0 cites
- 1970US7974595B2Methodology for assessing degradation due to radio frequency excitation of transistorsTEXAS INSTRUMENTS INC·Filed 2008·Granted Jul 5, 2011·6 cites·17 claims
- 2069US7737717B2Current-voltage-based method for evaluating thin dielectrics based on interface trapsTEXAS INSTRUMENTS INC·Filed 2008·Granted Jun 15, 2010·3 cites·16 claims
- 2169US6963111B2Efficient pMOS ESD protection circuitTEXAS INSTRUMENTS INC·Filed 2003·Granted Nov 8, 2005·15 cites·2 claims
- 2265US7196887B2PMOS electrostatic discharge (ESD) protection deviceTEXAS INSTRUMENTS INC·Filed 2003·Granted Mar 27, 2007·12 cites·11 claims
- 2361US2025024836A1Insecticide composition, formulations and process for preparation thereofRALLIS INDIA LTD·Filed 2022·Application pending·0 cites
- 2461US2025040550A1Insecticide composition, formulations and process for preparation thereofRALLIS INDIA LTD·Filed 2022·Application pending·0 cites
- 2558US2025374592A1Layout and modeling for ldmos with biased field plateTEXAS INSTRUMENTS INC·Filed 2024·Application pending·0 cites
- 2657US6709932B1Method for improving gate oxide integrity and interface quality in a multi-gate oxidation processTEXAS INSTRUMENTS INC·Filed 2002·Granted Mar 23, 2004·8 cites·13 claims
- 2755US6928376B2Apparatus and methods for ferroelectric ram fatigue testingTEXAS INSTRUMENTS INC·Filed 2002·Granted Aug 9, 2005·7 cites·30 claims
- 2854US7026838B2Versatile system for accelerated stress characterization of semiconductor device structuresTEXAS INSTRUMENTS INC·Filed 2004·Granted Apr 11, 2006·6 cites·20 claims
- 2950US8239814B2Parameter drift predictionREDDY VIJAY KUMAR·Filed 2009·Granted Aug 7, 2012·0 cites·14 claims
- 3039US7263455B2Apparatus and methods for ferroelectric ram fatigue testingTEXAS INSTRUMENTS INC·Filed 2005·Granted Aug 28, 2007·0 cites·7 claims
- 3136US2005218903A1Voltage waveform generation circuitTAXAS INSTR INCORPORTED·Filed 2004·Application pending·0 cites
- 3235US2003233624A1Method for predicting the degradation of an integrated circuit performance due to negative bias temperature instabilityTEXAS INSTRUMENTS INC·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →