Inventor · disambiguated record
Vicky Svidenko
Also filed as: SVIDENKO VICKY
11 granted patents·6 pending applications·128 citations·filing 2006–2023
89Inventor score
Files withAPPLIED MATERIALS INC10MICROSOFT TECHNOLOGY LICENSING LLC2APPLIED MATERIALS ISRAEL LTD1FORD GLOBAL TECH LLC1MICROSOFT CORP1
Top patents by PatentIndex Score
17 records- 0194US7760929B2Grouping systematic defects with feedback from electrical inspectionAPPLIED MATERIALS INC·Filed 2006·Granted Jul 20, 2010·42 cites·10 claims
- 0292US7760347B2Design-based method for grouping systematic defects in lithography pattern writing systemAPPLIED MATERIALS INC·Filed 2006·Granted Jul 20, 2010·22 cites·7 claims
- 0388US7937179B2Dynamic inline yield analysis and prediction of a defect limited yield using inline inspection defectsAPPLIED MATERIALS INC·Filed 2008·Granted May 3, 2011·24 cites·19 claims
- 0484US8049521B2Solar parametric testing module and processesAPPLIED MATERIALS INC·Filed 2009·Granted Nov 1, 2011·12 cites·15 claims
- 0583US7962864B2Stage yield predictionAPPLIED MATERIALS INC·Filed 2008·Granted Jun 14, 2011·15 cites·21 claims
- 0670US7956337B2Scribe process monitoring methodologyAPPLIED MATERIALS INC·Filed 2008·Granted Jun 7, 2011·4 cites·24 claims
- 0768US8799831B2Inline defect analysis for sampling and SPCNEHMADI YOUVAL·Filed 2008·Granted Aug 5, 2014·6 cites·24 claims
- 0863US9843494B2Channel availability checks with device monitoringMICROSOFT TECHNOLOGY LICENSING LLC·Filed 2015·Granted Dec 12, 2017·1 cites·17 claims
- 0958US2025174052A1Selective data collection from remote devicesFORD GLOBAL TECH LLC·Filed 2023·Application pending·0 cites
- 1052US8924904B2Method and apparatus for determining factors for design consideration in yield analysisSVIDENKO VICKY·Filed 2008·Granted Dec 30, 2014·2 cites·18 claims
- 1148US7844101B2System and method for performing post-plating morphological Cu grain boundary analysisAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted Nov 30, 2010·0 cites·20 claims
- 1247US2010197051A1Metrology and inspection suite for a solar production lineAPPLIED MATERIALS INC·Filed 2010·Application pending·0 cites
- 1347US2009104342A1Photovoltaic fabrication process monitoring and control using diagnostic devicesAPPLIED MATERIALS INC·Filed 2008·Application pending·0 cites
- 1445US8893308B2Counterfeit prevention for optical mediaMICROSOFT CORP·Filed 2012·Granted Nov 18, 2014·0 cites·20 claims
- 1542US2021065222A1User sentiment metricsMICROSOFT TECHNOLOGY LICENSING LLC·Filed 2019·Application pending·0 cites
- 1642US2010073011A1Light soaking system and test method for solar cellsAPPLIED MATERIALS INC·Filed 2009·Application pending·0 cites
- 1733US2011117680A1Inline detection of substrate positioning during processingAPPLIED MATERIALS INC·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →