Inventor · disambiguated record
Vinh N. Tran
Also filed as: TRAN VINH · TRAN VINH N
6 granted patents·8 pending applications·3 citations·filing 2011–2025
69Inventor score
Top patents by PatentIndex Score
14 records- 0184US2025323027A1Process kits and related methods for processing chambers to facilitate deposition process adjustabilityAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 0276US12456614B2Process kits and related methods for processing chambers to facilitate deposition process adjustabilityAPPLIED MATERIALS INC·Filed 2022·Granted Oct 28, 2025·0 cites·20 claims
- 0375US12354855B2Process kits and related methods for processing chambers to facilitate deposition process adjustabilityAPPLIED MATERIALS INC·Filed 2022·Granted Jul 8, 2025·0 cites·19 claims
- 0472US9992911B1Controllable conductance thermal interfaceNORTHROP GRUMMAN SYSTEMS CORP·Filed 2017·Granted Jun 5, 2018·3 cites·20 claims
- 0567US2025129477A1System for adjusting process chamber component temperatureAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 0660US2025003806A1Chamber kits, systems, and methods for calibrating temperature sensors for semiconductor manufacturingAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 0759US12221696B2Process kits and related methods for processing chambers to facilitate deposition process adjustabilityAPPLIED MATERIALS INC·Filed 2022·Granted Feb 11, 2025·0 cites·22 claims
- 0858US2025251280A1In-situ reflectometry for real-time selectivity monitoringAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 0957US2024141487A1Epi overlapping disk and ringAPPLIED MATERIALS INC·Filed 2022·Application pending·0 cites
- 1054US2024145273A1Multi-wavelength pyrometer for chamber monitoringAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 1152US11948818B2Temperature calibration with deposition and etch processAPPLIED MATERIALS INC·Filed 2021·Granted Apr 2, 2024·0 cites·20 claims
- 1249US2024035161A1Actively controlled pre-heat ring for process temperature controlAPPLIED MATERIALS INC·Filed 2022·Application pending·0 cites
- 1349US2024258141A1Methods and apparatus for calibration of substrate processing chamber placement via imagingAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 1437US8728944B2Method of removing contaminants and native oxides from a substrate surfaceKUPPURAO SATHEESH·Filed 2011·Granted May 20, 2014·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →