Inventor · disambiguated record
Vincent Truffert
Also filed as: TRUFFERT VINCENT · TRUFFERT VINCENT PATRICK THOMAS
4 granted patents·2 pending applications·7 citations·filing 2016–2023
65Inventor score
Top patents by PatentIndex Score
6 records- 0186US10656535B2Metrology method for a semiconductor manufacturing processIMEC VZW·Filed 2018·Granted May 19, 2020·3 cites·20 claims
- 0285US10481504B2Method and apparatus for semiconductor manufacturingIMEC VZW·Filed 2017·Granted Nov 19, 2019·3 cites·16 claims
- 0377US10824081B2Metrology method for a semiconductor manufacturing processIMEC VZW·Filed 2020·Granted Nov 3, 2020·1 cites·20 claims
- 0463US2025199418A1Measuring contrast and critical dimension using an alignment sensorASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 0559US2020050112A1Method and Apparatus for Semiconductor ManufacturingIMEC VZW·Filed 2019·Application pending·0 cites
- 0633US9874821B2Method for hotspot detection and ranking of a lithographic maskIMEC VZW·Filed 2016·Granted Jan 23, 2018·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →