Inventor · disambiguated record
Volker Drexel
Also filed as: DREXEL VOLKER
14 granted patents·147 citations·filing 1999–2018
91Inventor score
Top patents by PatentIndex Score
14 records- 0189US6498345B1Particle beam deviceLEO ELEKTRONENMIKROSKOPIE GMBH·Filed 1999·Granted Dec 24, 2002·64 cites·19 claims
- 0286US7425701B2Electron-beam device and detector systemZEISS CARL NTS GMBH·Filed 2004·Granted Sep 16, 2008·20 cites·20 claims
- 0381US7910887B2Electron-beam device and detector systemZEISS CARL NTS GMBH·Filed 2009·Granted Mar 22, 2011·4 cites·23 claims
- 0481US7462839B2Detector for variable pressure areas and an electron microscope comprising a corresponding detectorZEISS CARL NTS GMBH·Filed 2001·Granted Dec 9, 2008·26 cites·24 claims
- 0580US7507962B2Electron-beam device and detector systemZEISS CARL NTS GMBH·Filed 2006·Granted Mar 24, 2009·4 cites·13 claims
- 0672US8362443B2Objective lensZEISS CARL MICROSCOPY GMBH·Filed 2012·Granted Jan 29, 2013·2 cites·20 claims
- 0770US8178849B2Objective lensDREXEL VOLKER·Filed 2009·Granted May 15, 2012·2 cites·32 claims
- 0869US6872956B2Particle beam device with a particle source to be operated in high vacuum and cascade-type pump arrangement for such a particle beam deviceZEISS CARL NTS GMBH·Filed 2003·Granted Mar 29, 2005·17 cites·8 claims
- 0966US8164071B2Electron beam source and method of manufacturing the sameDREXEL VOLKER·Filed 2009·Granted Apr 24, 2012·2 cites·27 claims
- 1064US8431894B2Electron beam deviceESSERS ERIK·Filed 2005·Granted Apr 30, 2013·2 cites·35 claims
- 1158US7060978B2Detector system for a particle beam apparatus, and particle beam apparatus with such a detector systemZEISS CARL NTS GMBH·Filed 2001·Granted Jun 13, 2006·4 cites·20 claims
- 1249US8723138B2Electron beam source and method of manufacturing the sameDREXEL VOLKER·Filed 2012·Granted May 13, 2014·0 cites·41 claims
- 1341US8536773B2Electron beam source and method of manufacturing the sameBUEHLER WOLFRAM·Filed 2011·Granted Sep 17, 2013·0 cites·22 claims
- 1438US10446360B2Particle source for producing a particle beam and particle-optical apparatusZEISS CARL MICROSCOPY GMBH·Filed 2018·Granted Oct 15, 2019·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →