Inventor · disambiguated record
Wayne Hambek
Also filed as: HAMBEK WAYNE · HAMBEK WAYNE G
1 granted patent·1 pending application·1 citations·filing 2009–2021
15Inventor score
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2 records- 0140US8721906B2Method to increase yield and reduce down time in semiconductor fabrication units by preconditioning components using sub-aperture reactive atom etchHAMBEK WAYNE·Filed 2009·Granted May 13, 2014·1 cites·11 claims
- 0234US2022056808A1Main seal assemblyENTEGRIS INC·Filed 2021·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →