Inventor · disambiguated record
Wei-Sung Chen
Also filed as: CHEN WEI · CHEN WEI-SUNG
8 granted patents·3 pending applications·59 citations·filing 1993–2022
84Inventor score
Files withUNITED MICROELECTRONICS CORP3CHANG CHIA-CHUAN2CHEN WEI-SUNG2KUAN CHENG-CHUN1TAO XIAO-MING1
Top patents by PatentIndex Score
11 records- 0176US8663582B2Integral-type reaction cartridgeKUAN CHENG-CHUN·Filed 2010·Granted Mar 4, 2014·9 cites·3 claims
- 0270US5369316AAdvanced output buffer with reduced voltage swing at output terminalUNITED MICROELECTRONICS CORP·Filed 1993·Granted Nov 29, 1994·28 cites·12 claims
- 0368US8477539B2Non-volatile memory cell and methods for programming, erasing and reading thereofCHANG CHIA-CHUAN·Filed 2011·Granted Jul 2, 2013·5 cites·22 claims
- 0461US6544454B1Manufacturing process for a construction strip with colorful protective coating shellFiled 2000·Granted Apr 8, 2003·5 cites·4 claims
- 0560US8493794B2Non-volatile memory cell and methods for programming, erasing and reading thereofCHANG CHIA-CHUAN·Filed 2011·Granted Jul 23, 2013·3 cites·12 claims
- 0652US12419115B2Electrostatic discharge protection circuitVANGUARD INT SEMICONDUCT CORP·Filed 2022·Granted Sep 16, 2025·0 cites·15 claims
- 0744US2007257393A1Manufacturing method of an artificial strip for imitated rattan/willow furniture and a device system thereofCHEN WEI-SUNG·Filed 2006·Application pending·0 cites
- 0843US2007107136A1Method and apparatus for wet treatment of textiles and textile articles at low temperaturesTAO XIAO-MING·Filed 2006·Application pending·0 cites
- 0938US5671185AApparatus for replacing defective cells in a memory deviceUNITED MICROELECTRONICS CORP·Filed 1996·Granted Sep 23, 1997·8 cites·9 claims
- 1037US2008182073A1Manufacturing method of an artificial strip for imitative rattan/willow furniture and the artificial strip thereofCHEN WEI-SUNG·Filed 2007·Application pending·0 cites
- 1126US5369610AStatic memory with improved write-recoveryUNITED MICROELECTRONICS CORP·Filed 1993·Granted Nov 29, 1994·1 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →