Inventor · disambiguated record
Wei-Te Li
Also filed as: LI WEI TE
2 granted patents·0 citations·filing 2019–2022
27Inventor score
Technology areasH01J
Files withASML NETHERLANDS BV2
Top patents by PatentIndex Score
2 records- 0171US12165837B2System and method for scanning a sample using multi-beam inspection apparatusASML NETHERLANDS BV·Filed 2022·Granted Dec 10, 2024·0 cites·13 claims
- 0258US11469076B2System and method for scanning a sample using multi-beam inspection apparatusASML NETHERLANDS BV·Filed 2019·Granted Oct 11, 2022·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →