Inventor · disambiguated record
Wen-Tin Tai
Also filed as: TAI WEN-TIN
3 granted patents·1 citations·filing 2012–2020
55Inventor score
Technology areasH10P
Top patents by PatentIndex Score
3 records- 0182US12394674B2Method and machine for examining wafersASML NETHERLANDS BV·Filed 2020·Granted Aug 19, 2025·1 cites·23 claims
- 0256US10840156B2Method and machine for examining wafersASML NETHERLANDS BV·Filed 2017·Granted Nov 17, 2020·0 cites·20 claims
- 0344US9768082B2Method and machine for examining wafersCHOU CHIEN-HUNG·Filed 2012·Granted Sep 19, 2017·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →