Inventor · disambiguated record
Weiwen Xu
Also filed as: XU WEIWEN
2 granted patents·5 citations·filing 2013–2021
42Inventor score
Files withTOKYO ELECTRON LTD2
Top patents by PatentIndex Score
2 records- 0180US9059038B2System for in-situ film stack measurement during etching and etch control methodTOKYO ELECTRON LTD·Filed 2013·Granted Jun 16, 2015·5 cites·10 claims
- 0244US11423575B1Indirect determination of dynamic dark level of an imaging deviceTOKYO ELECTRON LTD·Filed 2021·Granted Aug 23, 2022·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →