Inventor · disambiguated record
Willem Marie Julia Marcel Coene
Also filed as: COENE WILLEM M J · COENE WILLEM M J M · COENE WILLEM MARIE · COENE WILLEM MARIE J M
56 granted patents·37 pending applications·433 citations·filing 1999–2024
98Inventor score
Files withKONINKL PHILIPS ELECTRONICS NV50ASML NETHERLANDS BV28SMILDE HENDRIK JAN HIDDE4COENE WILLEM MARIE JULIA MARCEL2HEKSTRA ANDRIES P2
Top patents by PatentIndex Score
93 records- 0199US9946167B2Metrology method and inspection apparatus, lithographic system and device manufacturing methodASML NETHERLANDS BV·Filed 2015·Granted Apr 17, 2018·18 cites·18 claims
- 0298US8411287B2Metrology method and apparatus, lithographic apparatus, device manufacturing method and substrateSMILDE HENDRIK JAN HIDDE·Filed 2010·Granted Apr 2, 2013·85 cites·33 claims
- 0397US9140998B2Metrology method and inspection apparatus, lithographic system and device manufacturing methodSMILDE HENDRIK JAN HIDDE·Filed 2011·Granted Sep 22, 2015·24 cites·12 claims
- 0495US10816909B2Metrology system and method for determining a characteristic of one or more structures on a substrateASML NETHERLANDS BV·Filed 2018·Granted Oct 27, 2020·5 cites·17 claims
- 0594US8553218B2Calibration method and apparatusTINNEMANS PATRICIUS ALOYSIUS JACOBUS·Filed 2010·Granted Oct 8, 2013·18 cites·22 claims
- 0693US8363220B2Method of determining overlay error and a device manufacturing methodASML NETHERLANDS BV·Filed 2010·Granted Jan 29, 2013·9 cites·20 claims
- 0792US7403138B2Coder and a method of coding for codes having a Repeated Maximum Transition Run constraint of 2KONINKL PHILIPS ELECTRONICS NV·Filed 2005·Granted Jul 22, 2008·13 cites·64 claims
- 0891US10890540B2Object identification and comparisonASML NETHERLANDS BV·Filed 2018·Granted Jan 12, 2021·4 cites·20 claims
- 0990US11143970B2Method and apparatus for image analysisASML NETHERLANDS BV·Filed 2020·Granted Oct 12, 2021·2 cites·23 claims
- 1089US12366811B2Metrology system and method for determining a characteristic of one or more structures on a substrateASML NETHERLANDS BV·Filed 2024·Granted Jul 22, 2025·0 cites·20 claims
- 1189US10732513B2Method and apparatus for image analysisASML NETHERLANDS BV·Filed 2019·Granted Aug 4, 2020·4 cites·20 claims
- 1289US10437157B2Method and apparatus for image analysisASML NETHERLANDS BV·Filed 2015·Granted Oct 8, 2019·5 cites·20 claims
- 1389US9915879B2Substrate and patterning device for use in metrology, metrology method and device manufacturing methodASML NETHERLANDS BV·Filed 2015·Granted Mar 13, 2018·4 cites·14 claims
- 1489US6654332B2Method for generating a binary signal having a predetermined spectral shapeKONINKL PHILIPS ELECTRONICS NV·Filed 2001·Granted Nov 25, 2003·31 cites·20 claims
- 1587US10585363B2Alignment systemASML NETHERLANDS BV·Filed 2016·Granted Mar 10, 2020·4 cites·15 claims
- 1687US10379448B2Methods and apparatus for predicting performance of a measurement method, measurement method and apparatusASML NETHERLANDS BV·Filed 2018·Granted Aug 13, 2019·3 cites·20 claims
- 1786US11415900B2Metrology system and method for determining a characteristic of one or more structures on a substrateASML NETHERLANDS BV·Filed 2020·Granted Aug 16, 2022·1 cites·20 claims
- 1883US8223347B2Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing methodSMILDE HENDRIK JAN HIDDE·Filed 2010·Granted Jul 17, 2012·4 cites·7 claims
- 1983US6469645B2Method of converting a stream of databits of a binary information signal into a stream of databits of a constrained binary channel signal, device for encoding, signal comprising a stream of databits of a constrained binary channel signal, record carrier and device for decodingKONINKL PHILIPS ELECTRONICS NV·Filed 2001·Granted Oct 22, 2002·14 cites·22 claims
- 2081US7119721B2Converting information words into different length code words depending on a property of a code signalKONINKL PHILIPS ELECTRONICS NV·Filed 2003·Granted Oct 10, 2006·12 cites·49 claims
- 2180US12326407B2Inspection apparatus and inspection methodASML NETHERLANDS BV·Filed 2023·Granted Jun 10, 2025·0 cites·20 claims
- 2279US11720029B2Method and apparatus for image analysisASML NETHERLANDS BV·Filed 2021·Granted Aug 8, 2023·0 cites·20 claims
- 2379US7116250B2Method and apparatus for multi-dimensionally encoding and decodingKONINKL PHILIPS ELECTRONICS NV·Filed 2003·Granted Oct 3, 2006·13 cites·30 claims
- 2478US7660224B2DC-controlled encoding for optical storage systemKONINKL PHILIPS ELECTRONICS NV·Filed 2005·Granted Feb 9, 2010·3 cites·10 claims
- 2578US7111225B2Viterbi bit detection method and deviceKONINKL PHILIPS ELECTRONICS NV·Filed 2003·Granted Sep 19, 2006·13 cites·26 claims
- 2678US2025014164A1Metrology method and method for training a data structure for use in metrologyASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 2777US12007700B2Metrology system and method for determining a characteristic of one or more structures on a substrateASML NETHERLANDS BV·Filed 2022·Granted Jun 11, 2024·0 cites·20 claims
- 2877US6678862B1Detection apparatusKONINKL PHILIPS ELECTRONICS NV·Filed 2000·Granted Jan 13, 2004·27 cites·8 claims
- 2976US7224296B2Error-correcting binary run-length-limited product-codeKONINKL PHILIPS ELECTRONICS NV·Filed 2003·Granted May 29, 2007·9 cites·83 claims
- 3075US10607334B2Method and apparatus for image analysisASML NETHERLANDS BV·Filed 2015·Granted Mar 31, 2020·2 cites·20 claims
- 3174US8520212B2Scatterometry method and measurement system for lithographyCOENE WILLEM MARIE JULIA MARCEL·Filed 2009·Granted Aug 27, 2013·4 cites·20 claims
- 3274US6731699B2Detector, reproduction system, receiver and methodKONINKL PHILIPS ELECTRONICS NV·Filed 2001·Granted May 4, 2004·10 cites·17 claims
- 3373US7489258B2Device and method for embedding a secondary signal in a primary data bit stream on an optical discKONINKL PHILIPS ELECTRONICS NV·Filed 2005·Granted Feb 10, 2009·3 cites·17 claims
- 3472US6486804B2Method of converting a stream of databits of a binary information signal into a stream of databits of a constrained binary channel signal, device for encoding, signal comprising a stream of databits of a constrained binary channel signal, record carrier, method for decoding, device for decodingKONINKL PHILIPS ELECTRONICS NV·Filed 2001·Granted Nov 26, 2002·9 cites·21 claims
- 3568US11692948B2Inspection apparatus and inspection methodASML NETHERLANDS BV·Filed 2019·Granted Jul 4, 2023·0 cites·20 claims
- 3666US7068574B2Record carrier, playback apparatus and information system comprising a record carrier and a playback apparatusKONINKL PHILIPS ELECTRONICS NV·Filed 2001·Granted Jun 27, 2006·7 cites·16 claims
- 3764US6529147B1Information carrier, device for encoding, method for encoding, device for decoding and method for decodingKONINKL PHILIPS ELECTRONICS NV·Filed 2000·Granted Mar 4, 2003·4 cites·14 claims
- 3864US2022309645A1Metrology Method and Method for Training a Data Structure for Use in MetrologyASML NETHERLANDS BV·Filed 2020·Application pending·0 cites
- 3962US6356215B1Device for encoding n-bit source words into corresponding m-bit channel words and decoding m-bit channel words into corresponding n-bit source wordsPHILIPS CORP·Filed 1999·Granted Mar 12, 2002·16 cites·21 claims
- 4061US7038600B2Method and device for adding or extracting a secondary information signal to/from a RLL code sequenceKONINKL PHILIPS ELECTRONICS NV·Filed 2001·Granted May 2, 2006·4 cites·10 claims
- 4160US6650257B2Information carrier, device for encoding, method for encoding, device for decoding and method for decodingKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted Nov 18, 2003·3 cites·18 claims
- 4259US12164233B2Metrology method and apparatus for of determining a complex-valued fieldASML NETHERLANDS BV·Filed 2020·Granted Dec 10, 2024·0 cites·14 claims
- 4359US7791507B2Coder and a method of coding for codes with a parity-complementary word assignment having a constraint of d=1 , r=2KONINKL PHILIPS ELECTRONICS NV·Filed 2006·Granted Sep 7, 2010·4 cites·40 claims
- 4458USRE44678ERecord carrier, playback apparatus and information system comprising a record carrier and a playback apparatusOOSTVEEN JOB CORNELIS·Filed 2008·Granted Dec 31, 2013·0 cites·41 claims
- 4558US2025355370A1Methods of mitigating crosstalk in metrology imagesASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 4656US9201311B2Methods and patterning devices for measuring phase aberrationCOENE WILLEM MARIE JULIA MARCEL·Filed 2012·Granted Dec 1, 2015·1 cites·41 claims
- 4756US9081304B2Substrate, an inspection apparatus, and a lithographic apparatusSMILDE HENDRIK JAN HIDDE·Filed 2009·Granted Jul 14, 2015·1 cites·14 claims
- 4856US7174497B2Method of storing or decoding a stream of bitsKONINKL PHILIPS ELECTRONICS NV·Filed 2001·Granted Feb 6, 2007·8 cites·19 claims
- 4956US6762987B2Slicer arrangementKONINKL PHILIPS ELECTRONICS NV·Filed 2001·Granted Jul 13, 2004·3 cites·8 claims
- 5055US7286064B2Two-dimensional modulation encoding for high density optical storageKONINKL PHILIPS ELECTRONICS NV·Filed 2004·Granted Oct 23, 2007·2 cites·17 claims
Showing the top 50 of 93 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →