Inventor · disambiguated record
William C. Leipold
Also filed as: LEIPOLD WILLIAM · LEIPOLD WILLIAM C · LEIPOLD WILLIAM CHARLES
36 granted patents·1 pending application·1,184 citations·filing 1995–2009
98Inventor score
Top patents by PatentIndex Score
37 records- 0198US6662350B2FinFET layout generationIBM·Filed 2002·Granted Dec 9, 2003·291 cites·19 claims
- 0294US6425112B1Auto correction of error checked simulated printed imagesIBM·Filed 1999·Granted Jul 23, 2002·235 cites·24 claims
- 0392US7353472B2System and method for testing pattern sensitive algorithms for semiconductor designIBM·Filed 2005·Granted Apr 1, 2008·14 cites·10 claims
- 0489US6395438B1Method of etch bias proximity correctionIBM·Filed 2001·Granted May 28, 2002·33 cites·20 claims
- 0589US6238850B1Method of forming sharp corners in a photoresist layerIBM·Filed 1999·Granted May 29, 2001·79 cites·12 claims
- 0688US7312141B2Shapes-based migration of aluminum designs to copper damasceneIBM·Filed 2005·Granted Dec 25, 2007·14 cites·17 claims
- 0785US6373975B1Error checking of simulated printed images with process window effects includedIBM·Filed 1999·Granted Apr 16, 2002·87 cites·25 claims
- 0885US5923563AVariable density fill shape generationIBM·Filed 1996·Granted Jul 13, 1999·119 cites·27 claims
- 0983US6539321B2Method for edge bias correction of topography-induced linewidth variationIBM·Filed 2001·Granted Mar 25, 2003·22 cites·62 claims
- 1083US6528883B1Shapes-based migration of aluminum designs to copper damasceneIBM·Filed 2000·Granted Mar 4, 2003·31 cites·3 claims
- 1179US6823496B2Physical design characterization systemIBM·Filed 2002·Granted Nov 23, 2004·26 cites·12 claims
- 1278US7257247B2Mask defect analysis systemIBM·Filed 2002·Granted Aug 14, 2007·13 cites·27 claims
- 1376US7492941B2Mask defect analysis systemIBM·Filed 2007·Granted Feb 17, 2009·3 cites·23 claims
- 1475US5552996AMethod and system using the design pattern of IC chips in the processing thereofIBM·Filed 1995·Granted Sep 3, 1996·55 cites·21 claims
- 1574US6948146B2Simplified tiling pattern methodIBM·Filed 2003·Granted Sep 20, 2005·20 cites·22 claims
- 1672US7492940B2Mask defect analysis systemIBM·Filed 2007·Granted Feb 17, 2009·2 cites·12 claims
- 1772US7051307B2Autonomic graphical partitioningIBM·Filed 2003·Granted May 23, 2006·17 cites·29 claims
- 1869US7404174B2method for generating a set of test patterns for an optical proximity correction algorithmIBM·Filed 2004·Granted Jul 22, 2008·11 cites·7 claims
- 1967US7415695B2System for search and analysis of systematic defects in integrated circuitsIBM·Filed 2007·Granted Aug 19, 2008·3 cites·19 claims
- 2067US6992002B2Shapes-based migration of aluminum designs to copper damascenceIBM·Filed 2002·Granted Jan 31, 2006·12 cites·3 claims
- 2166US6704695B1Interactive optical proximity correction design methodIBM·Filed 1999·Granted Mar 9, 2004·24 cites·23 claims
- 2265US7584077B2Physical design characterization systemIBM·Filed 2004·Granted Sep 1, 2009·11 cites·8 claims
- 2365US7498250B2Shapes-based migration of aluminum designs to copper damasceneIBM·Filed 2007·Granted Mar 3, 2009·2 cites·13 claims
- 2464US8201132B2System and method for testing pattern sensitive algorithms for semiconductor designDEMARIS DAVID L·Filed 2009·Granted Jun 12, 2012·1 cites·8 claims
- 2562US6261724B1Method of modifying a microchip layout data set to generate a predicted mask printed data setIBM·Filed 1999·Granted Jul 17, 2001·20 cites·13 claims
- 2661US6667136B2Method to control nested to isolated line printingIBM·Filed 2002·Granted Dec 23, 2003·5 cites·9 claims
- 2760US7709967B2Shapes-based migration of aluminum designs to copper damasceneIBM·Filed 2007·Granted May 4, 2010·1 cites·20 claims
- 2860US7284230B2System for search and analysis of systematic defects in integrated circuitsIBM·Filed 2003·Granted Oct 16, 2007·6 cites·21 claims
- 2956US7685544B2Testing pattern sensitive algorithms for semiconductor designIBM·Filed 2007·Granted Mar 23, 2010·0 cites·10 claims
- 3052US6429469B1Optical Proximity Correction Structures Having Decoupling CapacitorsIBM·Filed 2000·Granted Aug 6, 2002·5 cites·7 claims
- 3150US7552417B2System for search and analysis of systematic defects in integrated circuitsIBM·Filed 2008·Granted Jun 23, 2009·0 cites·7 claims
- 3250US2008247633A1System for generating a set of test patterns for an optical proximity correction algorithmDEMARIS DAVID L·Filed 2008·Application pending·0 cites
- 3345US6760901B2Trough adjusted optical proximity correction for viasIBM·Filed 2002·Granted Jul 6, 2004·2 cites·20 claims
- 3443US7669159B2IC tiling pattern method, IC so formed and analysis methodIBM·Filed 2005·Granted Feb 23, 2010·0 cites·12 claims
- 3540US6258490B1Transmission control mask utilized to reduce foreshortening effectsIBM·Filed 1999·Granted Jul 10, 2001·6 cites·15 claims
- 3638US6458493B2Method to control nested to isolated line printingIBM·Filed 1999·Granted Oct 1, 2002·4 cites·12 claims
- 3738US5740071AMethod and apparatus for selective shape adjustment of hierarchical designsIBM·Filed 1995·Granted Apr 14, 1998·10 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →