Inventor · disambiguated record
William Stewart Mcknight
Also filed as: MCKNIGHT WILLIAM · MCKNIGHT WILLIAM S · MCKNIGHT WILLIAM STEWART
15 granted patents·4 pending applications·331 citations·filing 1984–2008
93Inventor score
Top patents by PatentIndex Score
19 records- 0196US7015690B2Omnidirectional eddy current probe and inspection systemGEN ELECTRIC·Filed 2004·Granted Mar 21, 2006·127 cites·19 claims
- 0293US4562392AStylus type touch probe systemGEN ELECTRIC·Filed 1984·Granted Dec 31, 1985·71 cites·8 claims
- 0389US6812697B2Molded eddy current array probeGEN ELECTRIC·Filed 2002·Granted Nov 2, 2004·44 cites·12 claims
- 0487US7689030B2Methods and apparatus for testing a componentGEN ELECTRIC·Filed 2005·Granted Mar 30, 2010·17 cites·17 claims
- 0587US7206706B2Inspection method and system using multifrequency phase analysisGEN ELECTRIC·Filed 2005·Granted Apr 17, 2007·18 cites·21 claims
- 0676US7952348B2Flexible eddy current array probe and methods of assembling the sameGEN ELECTRIC·Filed 2007·Granted May 31, 2011·8 cites·14 claims
- 0775US8269489B2System and method for eddy current inspection of parts with complex geometriesWANG CHANGTING·Filed 2008·Granted Sep 18, 2012·6 cites·12 claims
- 0875US7337651B2Method for performing model based scanplan generation of a component under inspectionGEN ELECTRIC·Filed 2005·Granted Mar 4, 2008·6 cites·21 claims
- 0969US7154265B2Eddy current probe and inspection methodGEN ELECTRIC·Filed 2004·Granted Dec 26, 2006·10 cites·12 claims
- 1065US7888932B2Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the sameGEN ELECTRIC·Filed 2007·Granted Feb 15, 2011·3 cites·11 claims
- 1165US7817845B2Multi-frequency image processing for inspecting parts having complex geometric shapesGEN ELECTRIC·Filed 2006·Granted Oct 19, 2010·7 cites·17 claims
- 1265US7436992B2Methods and apparatus for testing a componentGEN ELECTRIC·Filed 2004·Granted Oct 14, 2008·6 cites·20 claims
- 1362US6696830B2Method and inspection standard for eddy current inspectionGEN ELECTRIC·Filed 2002·Granted Feb 24, 2004·4 cites·20 claims
- 1460US7994780B2System and method for inspection of parts with an eddy current probeGEN ELECTRIC·Filed 2007·Granted Aug 9, 2011·2 cites·20 claims
- 1557US8013599B2Methods and apparatus for testing a componentGEN ELECTRIC·Filed 2004·Granted Sep 6, 2011·2 cites·11 claims
- 1652US2007222439A1Eddy current array probes with enhanced drive fieldsGEN ELECTRIC·Filed 2007·Application pending·0 cites
- 1750US2006132123A1Eddy current array probes with enhanced drive fieldsGEN ELECTRIC·Filed 2004·Application pending·0 cites
- 1846US2011004452A1Method for compensation of responses from eddy current probesKORUKONDA SANGHAMITHRA·Filed 2007·Application pending·0 cites
- 1946US2010312494A1Process and apparatus for testing a component using an omni-directional eddy current probeKORUKONDA SANGHAMITHRA·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →