Inventor · disambiguated record
William N. Thompson
Also filed as: THOMPSON WILLIAM N
27 granted patents·1 pending application·409 citations·filing 1998–2006
97Inventor score
Top patents by PatentIndex Score
28 records- 0192US7180386B2Variable resistance circuitMICRON TECHNOLOGY INC·Filed 2005·Granted Feb 20, 2007·15 cites·23 claims
- 0287US6005797ALatch-up prevention for memory cellsMICRON TECHNOLOGY INC·Filed 1998·Granted Dec 21, 1999·47 cites·21 claims
- 0386US6445259B1Method to find a value within a range using weighted subrangesMICRON TECHNOLOGY INC·Filed 2001·Granted Sep 3, 2002·17 cites·24 claims
- 0486US6128244AMethod and apparatus for accessing one of a plurality of memory units within an electronic memory deviceMICRON TECHNOLOGY INC·Filed 1998·Granted Oct 3, 2000·78 cites·54 claims
- 0584US6958661B2Variable resistance circuitMICRON TECHNOLOGY INC·Filed 2003·Granted Oct 25, 2005·15 cites·12 claims
- 0682US6476640B2Method for buffering an input signalMICRON TECHNOLOGY INC·Filed 2001·Granted Nov 5, 2002·20 cites·9 claims
- 0781US6040713ABuffer with fast edge propagationMICRON TECHNOLOGY INC·Filed 1998·Granted Mar 21, 2000·30 cites·31 claims
- 0880US6545560B1Method to find a value within a range using weighted subrangesMICRON TECHNOLOGY INC·Filed 2001·Granted Apr 8, 2003·16 cites·36 claims
- 0978US6239618B1Buffer with fast edge propagationMICRON TECHNOLOGY INC·Filed 2000·Granted May 29, 2001·16 cites·35 claims
- 1077US6642588B1Latch-up prevention for memory cellsMICRON TECHNOLOGY INC·Filed 2000·Granted Nov 4, 2003·16 cites·38 claims
- 1174US6545561B2Method to find a value within a range using weighted subrangesMICRON TECHNOLOGY INC·Filed 2001·Granted Apr 8, 2003·8 cites·24 claims
- 1274US6469591B2Method to find a value within a range using weighted subrangesMICRON TECHNOLOGY INC·Filed 2001·Granted Oct 22, 2002·8 cites·24 claims
- 1374US6384714B2Method to find a value within a range using weighted subrangesMICRON TECHNOLOGY INC·Filed 2001·Granted May 7, 2002·8 cites·46 claims
- 1472US6657512B2Method to find a value within a range using weighted subrangesMICRON TECHNOLOGY INC·Filed 2002·Granted Dec 2, 2003·10 cites·18 claims
- 1568US6556095B2Method to find a value within a range using weighted subrangesMICRON TECHNOLOGY INC·Filed 2001·Granted Apr 29, 2003·6 cites·24 claims
- 1667US6516363B1Output data path having selectable data ratesMICRON TECHNOLOGY INC·Filed 1999·Granted Feb 4, 2003·20 cites·61 claims
- 1767US6088278ALatching sense amplifier structure with pre-amplifierMICRON TECHNOLOGY INC·Filed 1998·Granted Jul 11, 2000·26 cites·26 claims
- 1864US6376297B1Latch-up prevention for memory cellsMICRON TECHNOLOGY INC·Filed 1999·Granted Apr 23, 2002·15 cites·12 claims
- 1960US6767784B2Latch-up prevention for memory cellsMICRON TECHNOLOGY INC·Filed 2000·Granted Jul 27, 2004·7 cites·15 claims
- 2058US6823407B2Output data path capable of multiple data ratesMICRON TECHNOLOGY INC·Filed 2003·Granted Nov 23, 2004·7 cites·43 claims
- 2152US7190610B2Latch-up prevention for memory cellsMICRON TECHNOLOGY INC·Filed 2005·Granted Mar 13, 2007·2 cites·17 claims
- 2252US7018889B2Latch-up prevention for memory cellsMICRON TECHNOLOGY INC·Filed 2004·Granted Mar 28, 2006·4 cites·20 claims
- 2345US6275119B1Method to find a value within a range using weighted subrangesMICRON TECHNOLOGY INC·Filed 1999·Granted Aug 14, 2001·4 cites·25 claims
- 2441US6301188B1Method and apparatus for registering free flow informationMICRON TECHNOLOGY INC·Filed 1999·Granted Oct 9, 2001·7 cites·30 claims
- 2541US6026031ARelaxed write timing for a memory deviceMICRON TECHNOLOGY INC·Filed 1998·Granted Feb 15, 2000·6 cites·6 claims
- 2638US2006128090A1Latch-up prevention for memory cellsPORTER JOHN D·Filed 2006·Application pending·0 cites
- 2735US6865628B2Output data path capable of multiple data ratesMICRON TECHNOLOGY INC·Filed 2003·Granted Mar 8, 2005·0 cites·45 claims
- 2832US6310820B1Relaxed write timing for a memory deviceMICRON TECHNOLOGY INC·Filed 1999·Granted Oct 30, 2001·1 cites·30 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →