Inventor · disambiguated record

Wielfried Vandervorst

Also filed as: VANDERVORST WIELFRIED

1 granted patent·9 citations·filing 1988–1988

31Inventor score

Technology areasH01J

Files withCAMECA1

Top patents by PatentIndex Score

1 record

0147US4912325AMethod for sample analysis by sputtering with a particle beam, and device to implement said methodCAMECA·Filed 1988·Granted Mar 27, 1990·9 cites·5 claims

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →