Inventor · disambiguated record
Willem Louis Van Mierlo
Also filed as: VAN MIERLO WILLEM LOUIS
3 granted patents·3 pending applications·1 citations·filing 2019–2024
50Inventor score
Files withASML NETHERLANDS BV6
Top patents by PatentIndex Score
6 records- 0172US11646174B2Method for calibrating a scanning charged particle microscopeASML NETHERLANDS BV·Filed 2019·Granted May 9, 2023·1 cites·11 claims
- 0271US11972922B2Method for calibrating a scanning charged particle microscopeASML NETHERLANDS BV·Filed 2023·Granted Apr 30, 2024·0 cites·11 claims
- 0358US11796920B2Method for controlling a manufacturing process and associated apparatusesASML NETHERLANDS BV·Filed 2021·Granted Oct 24, 2023·0 cites·20 claims
- 0455US2024297013A1Aligning a distorted imageASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 0552US2025336046A1System and method for distortion adjustment during inspectionASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 0644US2025044709A1Method and apparatus to determine overlayASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →