Inventor · disambiguated record
Woon-Bok Lee
Also filed as: LEE WOON-BOK
4 granted patents·142 citations·filing 2003–2013
76Inventor score
Top patents by PatentIndex Score
4 records- 0195US7002364B2Semiconductor device for reducing the number of probing pad used during wafer test and method for testing the sameHYNIX SEMICONDUCTOR INC·Filed 2003·Granted Feb 21, 2006·132 cites·53 claims
- 0258US7057951B2Semiconductor memory device for controlling write recovery timeHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Jun 6, 2006·8 cites·19 claims
- 0354US8804447B2Semiconductor memory device for controlling write recovery time658868 N B INC·Filed 2013·Granted Aug 12, 2014·1 cites·18 claims
- 0452USRE44218ESemiconductor memory device for controlling write recovery timeIM JAE-HYUK·Filed 2011·Granted May 14, 2013·1 cites·33 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →