Inventor · disambiguated record
Wuudiann Ke
Also filed as: KE WUUDIANN
14 granted patents·616 citations·filing 1995–2001
95Inventor score
Top patents by PatentIndex Score
14 records- 0195US6269467B1Block based design methodologyCADENCE DESIGN SYSTEMS INC·Filed 1999·Granted Jul 31, 2001·203 cites·16 claims
- 0291US6725432B2Blocked based design methodologyCADENCE DESIGN SYSTEMS INC·Filed 2001·Granted Apr 20, 2004·45 cites·13 claims
- 0391US6567957B1Block based design methodologyCADENCE DESIGN SYSTEMS INC·Filed 2001·Granted May 20, 2003·48 cites·10 claims
- 0490US6701504B2Block based design methodologyCADENCE DESIGN SYSTEMS INC·Filed 2001·Granted Mar 2, 2004·40 cites·42 claims
- 0589US6574778B2Block based design methodologyCADENCE DESIGN SYSTEMS INC·Filed 2001·Granted Jun 3, 2003·38 cites·6 claims
- 0687US6698002B2Blocked based design methodologyCADENCE DESIGN SYSTEMS INC·Filed 2001·Granted Feb 24, 2004·31 cites·31 claims
- 0787US6694501B2Block based design methodologyCADENCE DESIGN SYSTEMS INC·Filed 2001·Granted Feb 17, 2004·29 cites·20 claims
- 0887US6629293B2Block based design methodologyCADENCE DESIGN SYSTEMS INC·Filed 2001·Granted Sep 30, 2003·30 cites·10 claims
- 0985US6631470B2Block based design methodologyCADENCE DESIGN SYSTEMS INC·Filed 2001·Granted Oct 7, 2003·24 cites·16 claims
- 1085US6594800B2Block based design methodologyCADENCE DESIGN SYSTEMS INC·Filed 2001·Granted Jul 15, 2003·25 cites·8 claims
- 1172US5841788AMethods for backplane interconnect testingLUCENT TECHNOLOGIES INC·Filed 1996·Granted Nov 24, 1998·36 cites·7 claims
- 1266US5774477AMethod and apparatus for pseudorandom boundary-scan testingLUCENT TECHNOLOGIES INC·Filed 1995·Granted Jun 30, 1998·27 cites·13 claims
- 1362US6108807AApparatus and method for hybrid pin control of boundary scan applicationsLUCENT TECHNOLOGIES INC·Filed 1997·Granted Aug 22, 2000·24 cites·17 claims
- 1450US5659552AMethod and apparatus for verifying test information on a backplane test busLUCENT TECHNOLOGIES INC·Filed 1995·Granted Aug 19, 1997·16 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →