Inventor · disambiguated record
Wun-Jie Lin
Also filed as: LIN WUN-JIE · LIN WUN-JIE HUNG
83 granted patents·25 pending applications·610 citations·filing 2011–2025
99Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD91TAIWAN SEMICONDUCTOR MFG12LIN WUN-JIE2HUANG CHIA-EN1LO CHING-HSIUNG1
Top patents by PatentIndex Score
108 records- 0197US11626719B2Electrostatic discharge (ESD) protection circuit and method of operating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Apr 11, 2023·7 cites·20 claims
- 0297US8735993B2FinFET body contact and method of making sameLO CHING-HSIUNG·Filed 2012·Granted May 27, 2014·412 cites·19 claims
- 0395US11862960B2Electrostatic discharge (ESD) protection circuit and method of operating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jan 2, 2024·2 cites·20 claims
- 0495US11862968B2Circuit and method for high voltage tolerant ESD protectionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jan 2, 2024·2 cites·19 claims
- 0595US11749673B2ESD protection deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Sep 5, 2023·2 cites·20 claims
- 0694US8928093B2FinFET body contact and method of making sameTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Jan 6, 2015·14 cites·20 claims
- 0794US8779517B2FinFET-based ESD devices and methods for forming the sameLIN WUN-JIE·Filed 2012·Granted Jul 15, 2014·24 cites·20 claims
- 0893US12087761B2Electrical passive elements of an ESD power clamp in a backside back end of line (B-BEOL) processTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Sep 10, 2024·1 cites·20 claims
- 0993US11728330B2Electrical passive elements of an ESD power clamp in a backside back end of line (B-BEOL) processTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Aug 15, 2023·2 cites·20 claims
- 1093US9876005B2SCRS with checker board layoutsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Jan 23, 2018·10 cites·20 claims
- 1193US9117669B2Apparatus for ESD protectionTAIWAN SEMICONDUCTOR MFG·Filed 2012·Granted Aug 25, 2015·13 cites·15 claims
- 1292US9397098B2FinFET-based ESD devices and methods for forming the sameTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Jul 19, 2016·13 cites·20 claims
- 1392US9312384B2FinFET body contact and method of making sameTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Apr 12, 2016·10 cites·20 claims
- 1491US11355491B2ESD protection deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jun 7, 2022·2 cites·20 claims
- 1591US10872190B2Method and system for latch-up preventionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Dec 22, 2020·5 cites·20 claims
- 1691US9190519B2FinFET-based ESD devices and methods for forming the sameTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Nov 17, 2015·8 cites·20 claims
- 1790US11569223B2Integrated circuit and method for fabricating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jan 31, 2023·2 cites·20 claims
- 1890US9728531B2Electrostatic discharge deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Aug 8, 2017·5 cites·20 claims
- 1990US9559008B2FinFET-based ESD devices and methods for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Jan 31, 2017·5 cites·20 claims
- 2089US12009657B2ESD clamp circuit for low leakage applicationsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jun 11, 2024·2 cites·20 claims
- 2188US10854595B2Electrostatic discharge deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Dec 1, 2020·3 cites·20 claims
- 2288US9318621B2Rotated STI diode on FinFET technologyTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Apr 19, 2016·7 cites·20 claims
- 2388US8779518B2Apparatus for ESD protectionTAIWAN SEMICONDUCTOR MANFACTURING COMPANY LTD·Filed 2012·Granted Jul 15, 2014·9 cites·19 claims
- 2488US2025366215A1High esd immunity field-effect device and manufacturing method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 2587US2025072108A1Capacitor cell and structure thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 2686US10777547B2ESD protection deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Sep 15, 2020·3 cites·20 claims
- 2784US11756953B2Electrostatic discharge protection deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Sep 12, 2023·1 cites·20 claims
- 2884US10096589B2Fin ESD protection diode and fabrication method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Oct 9, 2018·3 cites·20 claims
- 2983US11855076B2Electrostatic discharge (ESD) array with back end of line (BEOL) connection in a carrier waferTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Dec 26, 2023·1 cites·20 claims
- 3083US9812436B2SCRs with checker board layoutsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Nov 7, 2017·3 cites·20 claims
- 3183US9147676B2SCRs with checker board layoutsTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Sep 29, 2015·5 cites·20 claims
- 3283US2025330009A1Electrostatic discharge (esd) protection circuit and method of operating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 3382US12471326B2Guard ring and circuit deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Nov 11, 2025·0 cites·4 claims
- 3482US12191655B2Circuit and method for high voltage tolerant ESD protectionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jan 7, 2025·0 cites·20 claims
- 3582US12176341B2Electrostatic discharge (ESD) array with back end of line (BEOL) connection in a carrier waferTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Dec 24, 2024·0 cites·20 claims
- 3682US10026727B2FinFET-based ESD devices and methods for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Jul 17, 2018·2 cites·20 claims
- 3782US2024386180A1Method and system for latch-up preventionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 3882US2025364804A1Semiconductor device and electrostatic discharge clamp circuitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 3982US2025357753A1ESD Power Clamp Devices and CircuitsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 4081US12513999B2ESD protection deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Dec 30, 2025·0 cites·20 claims
- 4181US12170283B2Capacitor cell and structure thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Dec 17, 2024·0 cites·20 claims
- 4281US12100702B2Method of making semiconductor device electrostatic discharge diodeTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Sep 24, 2024·0 cites·20 claims
- 4380US12471387B2High ESD immunity field-effect device and manufacturing method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Nov 11, 2025·0 cites·20 claims
- 4480US12412019B2Method and system for latch-up preventionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Sep 9, 2025·0 cites·20 claims
- 4580US12401189B2ESD power clamp devices and circuitsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Aug 26, 2025·0 cites·20 claims
- 4680US12388250B2Electrostatic discharge (ESD) protection circuit and method of operating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Aug 12, 2025·0 cites·20 claims
- 4780US9461170B2FinFET with ESD protectionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Oct 4, 2016·4 cites·20 claims
- 4880US8664723B1Integrated circuit structures having base resistance tuning regions and methods for forming the sameTAIWAN SEMICONDUCTOR MFG·Filed 2012·Granted Mar 4, 2014·5 cites·20 claims
- 4980US2025125611A1Circuit and method for high voltage tolerant esd protectionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 5080US2025089379A1Electrostatic discharge (esd) array with back end of line (beol) connection in a carrier waferTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
Showing the top 50 of 108 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →