Inventor · disambiguated record
Xiaoyu Ji
Also filed as: JI XIAOYU
6 granted patents·11 pending applications·6 citations·filing 2016–2024
72Inventor score
Top patents by PatentIndex Score
17 records- 0190US12196692B2Systems and methods for voltage contrast defect detectionASML NETHERLANDS BV·Filed 2020·Granted Jan 14, 2025·2 cites·20 claims
- 0283US11513087B2Systems and methods for voltage contrast defect detectionASML NETHERLANDS BV·Filed 2020·Granted Nov 29, 2022·1 cites·15 claims
- 0383US2025208074A1Systems and methods for voltage contrast defect detectionASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 0477US2025037967A1Charged particle beam apparatus with multiple detectors and methods for imagingASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 0572US10673474B2Anti-interference method and circuit, and mobile terminalZTE CORP·Filed 2016·Granted Jun 2, 2020·3 cites·16 claims
- 0667US12142455B2Charged particle beam apparatus with multiple detectors and methods for imagingASML NETHERLANDS BV·Filed 2021·Granted Nov 12, 2024·0 cites·15 claims
- 0757US2025336635A1Charged-particle beam apparatus with fast focus correction and methods thereofASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 0856US2025027990A1Charged-particle beam apparatus for voltage-contrast inspection and methods thereofASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 0956US2025246397A1Charged-particle beam apparatus with large field-of-view and methods thereofASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 1054US2025336636A1Method and system for fine focusing secondary beam spots on detector for multi-beam inspection apparatusASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 1153US12423472B2Camera with privacy protection function and privacy protection methodUNIV ZHEJIANG·Filed 2023·Granted Sep 23, 2025·0 cites·7 claims
- 1251US2024021404A1Charged-particle beam apparatus with beam-tilt and methods thereofASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 1351US2022215652A1Method and system for generating image adversarial examples based on an acoustic waveUNIV ZHEJIANG·Filed 2022·Application pending·0 cites
- 1449US2025232941A1Wafer edge inspection of charged particle inspection systemASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 1548US2024420916A1Wafer edge inspection of charged particle inspection systemASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 1647US2025218090A1Blendshape weights predicted for facial expression of hmd wearer using machine learning model for cohort corresponding to facial type of wearerHEWLETT PACKARD DEVELOPMENT CO·Filed 2022·Application pending·0 cites
- 1740US11450324B2Method of defending against inaudible attacks on voice assistant based on machine learningUNIV ZHEJIANG·Filed 2020·Granted Sep 20, 2022·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →