Inventor · disambiguated record
Ximan Jiang
Also filed as: JIANG XIMAN
11 granted patents·111 citations·filing 2002–2021
87Inventor score
Top patents by PatentIndex Score
11 records- 0195US6768120B2Focused electron and ion beam systemsUNIV CALIFORNIA·Filed 2002·Granted Jul 27, 2004·86 cites·14 claims
- 0286US7609815B2High brightness—multiple beamlets source for patterned X-ray productionUNIV CALIFORNIA·Filed 2007·Granted Oct 27, 2009·11 cites·19 claims
- 0381US9841512B2System and method for reducing radiation-induced false counts in an inspection systemKLA TENCOR CORP·Filed 2015·Granted Dec 12, 2017·2 cites·32 claims
- 0481US9691592B2Plasma source enhanced with booster chamber and low cost plasma strength sensorJIANG XIMAN·Filed 2016·Granted Jun 27, 2017·3 cites·20 claims
- 0581US8723115B2Method and apparatus for detecting buried defectsXIAO HONG·Filed 2012·Granted May 13, 2014·4 cites·14 claims
- 0675US9460886B2High resolution high quantum efficiency electron bombarded CCD or CMOS imaging sensorKLA TENCOR CORP·Filed 2015·Granted Oct 4, 2016·2 cites·21 claims
- 0773US9116109B2Method and apparatus for detecting buried defectsKLA TENCOR CORP·Filed 2014·Granted Aug 25, 2015·2 cites·2 claims
- 0870US9997335B2Plasma source enhanced with booster chamber and low cost plasma strength sensorJIANG XIMAN·Filed 2017·Granted Jun 12, 2018·1 cites·8 claims
- 0959US10241217B2System and method for reducing radiation-induced false counts in an inspection systemKLA TENCOR CORP·Filed 2017·Granted Mar 26, 2019·0 cites·21 claims
- 1047US9666419B2Image intensifier tube design for aberration correction and ion damage reductionKLA TENCOR CORP·Filed 2013·Granted May 30, 2017·0 cites·40 claims
- 1146US11830705B2Plasma flood gun for charged particle apparatusPIE SCIENT LLC·Filed 2021·Granted Nov 28, 2023·0 cites·36 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →