Inventor · disambiguated record
Xuesong Lu
Also filed as: LU XUESONG
19 granted patents·2 pending applications·17 citations·filing 2012–2022
89Inventor score
Top patents by PatentIndex Score
21 records- 0189US11562909B2Directional selective junction clean with field polymer protectionsAPPLIED MATERIALS INC·Filed 2020·Granted Jan 24, 2023·2 cites·8 claims
- 0289US10184904B1Core holder for micron CT observation and experimental method thereofPETROCHINA CO LTD·Filed 2018·Granted Jan 22, 2019·8 cites·10 claims
- 0385US11749543B2Chamber matching and calibrationAPPLIED MATERIALS INC·Filed 2020·Granted Sep 5, 2023·2 cites·18 claims
- 0474US10655223B2Advanced coating method and materials to prevent HDP-CVD chamber arcingAPPLIED MATERIALS INC·Filed 2019·Granted May 19, 2020·0 cites·20 claims
- 0574US9881787B2Deposition methods for uniform and conformal hybrid titanium oxide filmsAPPLIED MATERIALS INC·Filed 2016·Granted Jan 30, 2018·2 cites·12 claims
- 0670US10208380B2Advanced coating method and materials to prevent HDP-CVD chamber arcingAPPLIED MATERIALS INC·Filed 2016·Granted Feb 19, 2019·1 cites·20 claims
- 0767US12463052B2Directional selective junction clean with field polymer protectionsAPPLIED MATERIALS INC·Filed 2022·Granted Nov 4, 2025·0 cites·8 claims
- 0867US10002745B2Plasma treatment process for in-situ chamber cleaning efficiency enhancement in plasma processing chamberAPPLIED MATERIALS INC·Filed 2016·Granted Jun 19, 2018·1 cites·17 claims
- 0965US12347695B2Methods for controlling contact resistance in cobalt-titanium structuresAPPLIED MATERIALS INC·Filed 2022·Granted Jul 1, 2025·0 cites·13 claims
- 1062US10192763B2Methodology for chamber performance matching for semiconductor equipmentAPPLIED MATERIALS INC·Filed 2015·Granted Jan 29, 2019·1 cites·17 claims
- 1156US11424132B2Methods and apparatus for controlling contact resistance in cobalt-titanium structuresAPPLIED MATERIALS INC·Filed 2019·Granted Aug 23, 2022·0 cites·13 claims
- 1254US11830725B2Method of cleaning a structure and method of depositing a capping layer in a structureAPPLIED MATERIALS INC·Filed 2021·Granted Nov 28, 2023·0 cites·20 claims
- 1353US10883932B2Advanced in-situ particle detection system for semiconductor substrate processing systemsAPPLIED MATERIALS INC·Filed 2019·Granted Jan 5, 2021·0 cites·21 claims
- 1452US10365216B2Advanced in-situ particle detection system for semiconductor substrate processing systemsAPPLIED MATERIALS INC·Filed 2017·Granted Jul 30, 2019·0 cites·19 claims
- 1552US2013199606A1Methods of manufacturing back surface field and metallized contacts on a solar cell deviceSHENG SHURAN·Filed 2012·Application pending·0 cites
- 1649US11268944B2Method for determining gas saturation of tight reservoirPETROCHINA CO LTD·Filed 2020·Granted Mar 8, 2022·0 cites·9 claims
- 1746US10884155B2Method and apparatus for measuring oil content of tight reservoir based on nuclear magnetic resonancePETROCHINA CO LTD·Filed 2018·Granted Jan 5, 2021·0 cites·31 claims
- 1845US10598595B2Method for determining oil contents in rock formationsPETROCHINA CO LTD·Filed 2017·Granted Mar 24, 2020·0 cites·16 claims
- 1942US10533944B2Method for determining maturity in oil source rock by total scanning fluorescence and the device thereforPETROCHINA CO LTD·Filed 2018·Granted Jan 14, 2020·0 cites·8 claims
- 2041US12068180B2Advanced temperature monitoring system and methods for semiconductor manufacture productivityAPPLIED MATERIALS INC·Filed 2019·Granted Aug 20, 2024·0 cites·11 claims
- 2133US2017114462A1High productivity pecvd tool for wafer processing of semiconductor manufacturingAPPLIED MATERIALS INC·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →