Inventor · disambiguated record
Yang-Hung Cheng
Also filed as: CHENG YANG-HUNG
3 granted patents·1 pending application·0 citations·filing 2020–2025
40Inventor score
Technology areasG01R
Files withMPI CORP4
Top patents by PatentIndex Score
4 records- 0183US2025341544A1Probe card, method for designing probe card, connection carrier boaed, method for producing tested semiconductor device, method for testing unpackaged semiconductor by probe card, device under test and probe systemMPI CORP·Filed 2025·Application pending·0 cites
- 0273US12392803B2Probe card, method for designing probe card, method for producing tested semiconductor device method for testing unpackaged semiconductor by probe card, device under test and probe systemMPI CORP·Filed 2023·Granted Aug 19, 2025·0 cites·20 claims
- 0349US11774468B2Vertical probe headMPI CORP·Filed 2022·Granted Oct 3, 2023·0 cites·21 claims
- 0442US11460498B2Adjustable probe device for impedance testing for circuit boardMPI CORP·Filed 2020·Granted Oct 4, 2022·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →