Inventor · disambiguated record
Yasunori Doi
Also filed as: DOI YASUNORI
17 granted patents·577 citations·filing 1998–2015
95Inventor score
Top patents by PatentIndex Score
17 records- 0198US7138628B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2006·Granted Nov 21, 2006·35 cites·24 claims
- 0298US6538254B1Method and apparatus for sample fabricationHITACHI LTD·Filed 1998·Granted Mar 25, 2003·315 cites·19 claims
- 0397US7071475B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2004·Granted Jul 4, 2006·61 cites·8 claims
- 0497US6828566B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2003·Granted Dec 7, 2004·62 cites·24 claims
- 0596US7176458B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2006·Granted Feb 13, 2007·18 cites·13 claims
- 0695US7525108B2Focused ion beam apparatus for specimen fabricationHITACHI LTD·Filed 2007·Granted Apr 28, 2009·16 cites·30 claims
- 0795US7397050B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2007·Granted Jul 8, 2008·16 cites·25 claims
- 0895US7397052B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2007·Granted Jul 8, 2008·16 cites·11 claims
- 0992US7397051B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2007·Granted Jul 8, 2008·8 cites·9 claims
- 1091US8569719B2Method and apparatus for specimen fabricationTOMIMATSU SATOSHI·Filed 2011·Granted Oct 29, 2013·6 cites·18 claims
- 1186US8405053B2Method and apparatus for specimen fabricationTOMIMATSU SATOSHI·Filed 2011·Granted Mar 26, 2013·4 cites·3 claims
- 1286US7999240B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2008·Granted Aug 16, 2011·4 cites·14 claims
- 1384US9040905B2Analysis device and analysis methodNAGANO HISASHI·Filed 2011·Granted May 26, 2015·5 cites·20 claims
- 1484US7791050B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2008·Granted Sep 7, 2010·4 cites·36 claims
- 1583US9214324B2Analysis device and analysis methodHITACHI LTD·Filed 2015·Granted Dec 15, 2015·3 cites·4 claims
- 1679US9696288B2Attached matter testing device and testing methodHITACHI LTD·Filed 2012·Granted Jul 4, 2017·3 cites·11 claims
- 1760US9679106B2Medical information display apparatusTOSHIBA MEDICAL SYS CORP·Filed 2015·Granted Jun 13, 2017·1 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →