Inventor · disambiguated record
Yair Eran
Also filed as: ERAN YAIR
12 granted patents·956 citations·filing 1991–2006
94Inventor score
Top patents by PatentIndex Score
12 records- 0197US6268093B1Method for reticle inspection using aerial imagingAPPLIED MATERIALS INC·Filed 1999·Granted Jul 31, 2001·205 cites·32 claims
- 0295US5586058AApparatus and method for inspection of a patterned object by comparison thereof to a referenceORBOT INSTR LTD·Filed 1992·Granted Dec 17, 1996·160 cites·27 claims
- 0394US7133548B2Method and apparatus for reticle inspection using aerial imagingAPPLIED MATERIALS INC·Filed 2001·Granted Nov 7, 2006·53 cites·31 claims
- 0493US5619429AApparatus and method for inspection of a patterned object by comparison thereof to a referenceORBOT INSTR LTD·Filed 1991·Granted Apr 8, 1997·141 cites·5 claims
- 0590US5892579AOptical inspection method and apparatusORBOT INSTR LTD·Filed 1997·Granted Apr 6, 1999·109 cites·32 claims
- 0683US6360005B1Apparatus and method for microscopic inspection of articlesAPPLIED MATERIALS INC·Filed 1996·Granted Mar 19, 2002·77 cites·8 claims
- 0781US5619588AApparatus and method for comparing and aligning two digital representations of an imageORBOT INSTR LTD·Filed 1993·Granted Apr 8, 1997·63 cites·8 claims
- 0880US5907628AApparatus and method for comparing and aligning two digital representations of an imageORBOT INSTR LTD·Filed 1996·Granted May 25, 1999·74 cites·9 claims
- 0970US6072897ADimension error detection in objectAPPLIED MATERIALS INC·Filed 1997·Granted Jun 6, 2000·61 cites·53 claims
- 1067US7133549B2Local bias map using line width measurementsAPPLIED MATERIALS INC·Filed 2002·Granted Nov 7, 2006·10 cites·32 claims
- 1159US7486814B2Local bias map using line width measurementsAPPLIED MATERIALS INC·Filed 2006·Granted Feb 3, 2009·1 cites·37 claims
- 1237US7587700B2Process monitoring system and method for processing a large number of sub-micron measurement targetsAPPLIED MATERIALS ISRAEL LTD·Filed 2004·Granted Sep 8, 2009·2 cites·36 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →