Inventor · disambiguated record
Yasuo Furukawa
Also filed as: FURUKAWA YASUO
50 granted patents·14 pending applications·704 citations·filing 1978–2017
98Inventor score
Top patents by PatentIndex Score
64 records- 0197US6795496B1Jitter measuring device and methodADVANTEST CORP·Filed 2000·Granted Sep 21, 2004·117 cites·19 claims
- 0295US5113139ALow-distortion waveform generating method and waveform generator using the sameADVANTEST CORP·Filed 1991·Granted May 12, 1992·162 cites·4 claims
- 0393US6687868B1Test device and method for electrically testing electronic deviceADVANTEST CORP·Filed 2000·Granted Feb 3, 2004·60 cites·26 claims
- 0491US7301359B2Testing apparatus, and testing methodADVANTEST CORP·Filed 2006·Granted Nov 27, 2007·20 cites·4 claims
- 0588US10243408B2Wireless power receiverADVANTEST CORP·Filed 2017·Granted Mar 26, 2019·2 cites·12 claims
- 0687US4637027ALaser light source deviceFUJITSU LTD·Filed 1984·Granted Jan 13, 1987·32 cites·10 claims
- 0785US4177379ABack-scattered electron detector for use in an electron microscope or electron beam exposure system to detect back-scattered electronsFUJITSU LTD·Filed 1978·Granted Dec 4, 1979·22 cites·12 claims
- 0881US7463018B2Carrier module for adapting non-standard instrument cards to test systemsADVANTEST CORP·Filed 2008·Granted Dec 9, 2008·10 cites·17 claims
- 0981US4719645ARotary anode assembly for an X-ray sourceFUJITSU LTD·Filed 1986·Granted Jan 12, 1988·27 cites·15 claims
- 1080US8909966B2Wireless power supply apparatusFURUKAWA YASUO·Filed 2011·Granted Dec 9, 2014·8 cites·4 claims
- 1180US6687629B1Apparatus for and method of measuring a jitterADVANTEST CORP·Filed 1999·Granted Feb 3, 2004·38 cites·22 claims
- 1277US7362089B2Carrier module for adapting non-standard instrument cards to test systemsADVANTEST CORP·Filed 2004·Granted Apr 22, 2008·19 cites·27 claims
- 1377US5284702ALow fuming phenolic resin prepreg and process for producing the sameTOHO RAYON KK·Filed 1991·Granted Feb 8, 1994·29 cites·20 claims
- 1475US9071063B2Wireless power receiving apparatusENDO YUKI·Filed 2011·Granted Jun 30, 2015·5 cites·8 claims
- 1573US7242197B2Current measuring apparatus, test apparatus, and coaxial cable and assembled cable for the apparatusesHIRAKAWA HEWTECH CORP·Filed 2006·Granted Jul 10, 2007·8 cites·4 claims
- 1671US9329215B2Impedance measurement apparatusADVANTEST CORP·Filed 2014·Granted May 3, 2016·2 cites·14 claims
- 1771US8791601B2Wireless power receiving apparatus and wireless power supply systemFURUKAWA YASUO·Filed 2011·Granted Jul 29, 2014·4 cites·8 claims
- 1870US9633782B2Wireless power transmitterADVANTEST CORP·Filed 2013·Granted Apr 25, 2017·2 cites·14 claims
- 1968US8185336B2Test apparatus, test method, program, and recording medium reducing the influence of variationsFURUKAWA YASUO·Filed 2008·Granted May 22, 2012·4 cites·8 claims
- 2066US4459580ADA ConverterTAKEDA RIKEN IND CO LTD·Filed 1982·Granted Jul 10, 1984·17 cites·23 claims
- 2165US9589721B2Wireless power transmitter and wireless power receiverADVANTEST CORP·Filed 2014·Granted Mar 7, 2017·2 cites·40 claims
- 2265US7984353B2Test apparatus, test vector generate unit, test method, program, and recording mediumADVANTEST CORP·Filed 2008·Granted Jul 19, 2011·5 cites·20 claims
- 2363US7071721B2Device and method for electronic device testADVANTEST CORP·Filed 2003·Granted Jul 4, 2006·10 cites·18 claims
- 2462US9871413B2Wireless power receiving apparatusADVANTEST CORP·Filed 2015·Granted Jan 16, 2018·1 cites·13 claims
- 2562US4797931AAudio frequency signal identification apparatusKOKUSAI DENSHIN DENWA CO LTD·Filed 1987·Granted Jan 10, 1989·26 cites·4 claims
- 2661US6498998B1Method and apparatus for testing a semiconductor deviceADVANTEST CORP·Filed 2000·Granted Dec 24, 2002·11 cites·21 claims
- 2760US7395480B2Test apparatus and test methodADVANTEST CORP·Filed 2006·Granted Jul 1, 2008·3 cites·10 claims
- 2860US7023233B1Test apparatus and test methodADVANTEST CORP·Filed 2004·Granted Apr 4, 2006·7 cites·6 claims
- 2960US6654916B1Waveform generator, semiconductor testing device and semiconductor deviceADVANTEST CORP·Filed 1999·Granted Nov 25, 2003·23 cites·21 claims
- 3059US9552921B2Wireless power transmitter and wireless power receiverADVANTEST CORP·Filed 2013·Granted Jan 24, 2017·0 cites·25 claims
- 3157US7298162B2Test apparatus and test methodADVANTEST CORP·Filed 2006·Granted Nov 20, 2007·2 cites·3 claims
- 3256US6992497B2LSI testing apparatus for testing an electronic deviceADVANTEST CORP·Filed 2003·Granted Jan 31, 2006·7 cites·8 claims
- 3356US6404371B2Waveform generator and testing deviceADVANTEST CORP·Filed 2001·Granted Jun 11, 2002·4 cites·30 claims
- 3452US7859288B2Test apparatus and test method for testing a device based on quiescent currentADVANTEST CORP·Filed 2008·Granted Dec 28, 2010·1 cites·7 claims
- 3552US4612354AMethod for preventing polymer scale deposition in the polymerization of a vinylic monomerSHINETSU CHEMICAL CO·Filed 1982·Granted Sep 16, 1986·8 cites·7 claims
- 3651US9742201B2Wireless power receiving apparatusADVANTEST CORP·Filed 2014·Granted Aug 22, 2017·0 cites·14 claims
- 3751US7948256B2Measurement apparatus, test system, and measurement method for measuring a characteristic of a deviceADVANTEST CORP·Filed 2008·Granted May 24, 2011·0 cites·21 claims
- 3850US9966798B2Wireless power receiverADVANTEST CORP·Filed 2014·Granted May 8, 2018·0 cites·29 claims
- 3950US9882550B2Wireless power transmitting apparatus and wireless power supply systemADVANTEST CORP·Filed 2014·Granted Jan 30, 2018·0 cites·12 claims
- 4050US7126367B2Test apparatus, test method, electronic device, and electronic device manufacturing methodADVANTEST CORP·Filed 2004·Granted Oct 24, 2006·4 cites·5 claims
- 4149US8536887B2Probe circuit, multi-probe circuit, test apparatus, and electric deviceFURUKAWA YASUO·Filed 2010·Granted Sep 17, 2013·0 cites·19 claims
- 4249US2011140711A1Measurement circuit and electronic deviceADVANTEST CORP·Filed 2011·Application pending·0 cites
- 4348US2014132078A1Wireless power transmitterADVANTEST CORP·Filed 2013·Application pending·0 cites
- 4447US9893534B2Relay device of wireless power transmission systemADVANTEST CORP·Filed 2013·Granted Feb 13, 2018·0 cites·10 claims
- 4546US9640317B2Wireless power transmitter and wireless power receiverADVANTEST CORP·Filed 2014·Granted May 2, 2017·0 cites·28 claims
- 4643US2012267961A1Wireless power supply apparatusENDO YUKI·Filed 2012·Application pending·0 cites
- 4742US8195411B2IDDQ test apparatus and test methodKOJIMA SHOJI·Filed 2009·Granted Jun 5, 2012·0 cites·22 claims
- 4842US6894301B2Method and apparatus for testing circuit using light emissionADVANTEST CORP·Filed 2002·Granted May 17, 2005·1 cites·11 claims
- 4942US2012068548A1Wireless power supply apparatusENDO YUKI·Filed 2011·Application pending·0 cites
- 5042US2012228955A1Transmission coil for wireless power transmissionENDO YUKI·Filed 2012·Application pending·0 cites
Showing the top 50 of 64 patent records by PatentIndex Score.
Join the waitlist — get patent alerts
Get an alert when Yasuo Furukawa files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →