Inventor · disambiguated record
Yanir Hainick
Also filed as: HAINICK YANIR
21 granted patents·4 pending applications·17 citations·filing 2013–2025
92Inventor score
Files withNOVA LTD12NOVA MEASURING INSTR LTD11PXE COMPUTATION IMAGING LTD1PXE COMPUTATIONAL IMAGING LTD1
Top patents by PatentIndex Score
25 records- 0192US12066385B2Raman spectroscopy based measurements in patterned structuresNOVA LTD·Filed 2022·Granted Aug 20, 2024·1 cites·16 claims
- 0292US2025389665A1Hybrid metrology method and systemNOVA LTD·Filed 2025·Application pending·0 cites
- 0390US12366533B2Hybrid metrology method and systemNOVA LTD·Filed 2024·Granted Jul 22, 2025·0 cites·23 claims
- 0490US2025123210A1Raman spectroscopy based measurements in patterned structuresNOVA LTD·Filed 2024·Application pending·0 cites
- 0589US10161885B2Optical phase measurement method and systemNOVA MEASURING INSTR LTD·Filed 2015·Granted Dec 25, 2018·5 cites·19 claims
- 0688US12467879B2Optical phase measurement method and systemNOVA LTD·Filed 2024·Granted Nov 11, 2025·0 cites·16 claims
- 0788US11029258B2Optical phase measurement method and systemNOVA MEASURING INSTR LTD·Filed 2018·Granted Jun 8, 2021·2 cites·20 claims
- 0885US10732116B2Hybrid metrology method and systemNOVA MEASURING INSTR LTD·Filed 2016·Granted Aug 4, 2020·2 cites·20 claims
- 0985US10564106B2Raman spectroscopy based measurements in patterned structuresNOVA MEASURING INSTR LTD·Filed 2016·Granted Feb 18, 2020·2 cites·13 claims
- 1083US11946875B2Optical phase measurement system and methodNOVA LTD·Filed 2022·Granted Apr 2, 2024·0 cites·20 claims
- 1181US10365231B2Optical phase measurement method and systemNOVA MEASURING INSTR LTD·Filed 2018·Granted Jul 30, 2019·1 cites·17 claims
- 1279US12025560B2Hybrid metrology method and systemNOVA LTD·Filed 2021·Granted Jul 2, 2024·0 cites·24 claims
- 1375US11150190B2Hybrid metrology method and systemNOVA LTD·Filed 2020·Granted Oct 19, 2021·0 cites·24 claims
- 1475US10073045B2Optical method and system for measuring isolated features of a structureNOVA MEASURING INSTR LTD·Filed 2013·Granted Sep 11, 2018·2 cites·29 claims
- 1575US9897553B2Optical phase measurement method and systemNOVA MEASURING INSTR LTD·Filed 2014·Granted Feb 20, 2018·1 cites·20 claims
- 1674US2021364451A1Optical phase measurement method and systemNOVA MEASURING INSTR LTD·Filed 2021·Application pending·0 cites
- 1773US11275027B2Raman spectroscopy based measurements in patterned structuresNOVA LTD·Filed 2020·Granted Mar 15, 2022·0 cites·20 claims
- 1869US11460415B2Optical phase measurement system and methodNOVA LTD·Filed 2020·Granted Oct 4, 2022·0 cites·18 claims
- 1968US10274435B2Method and system for optical metrology in patterned structuresNOVA MEASURING INSTR LTD·Filed 2015·Granted Apr 30, 2019·1 cites·15 claims
- 2065US10663408B2Optical phase measurement system and methodNOVA MEASURING INSTR LTD·Filed 2019·Granted May 26, 2020·0 cites·20 claims
- 2159US2022390858A1Time-domain optical metrology and inspection of semiconductor devicesNOVA LTD·Filed 2022·Application pending·0 cites
- 2257US10761036B2Method and system for optical metrology in patterned structuresNOVA MEASURING INSTR LTD·Filed 2019·Granted Sep 1, 2020·0 cites·20 claims
- 2352US11366398B2Time-domain optical metrology and inspection of semiconductor devicesNOVA LTD·Filed 2019·Granted Jun 21, 2022·0 cites·16 claims
- 2450US12422251B2System and method for optical imaging and measurement of objectsPXE COMPUTATIONAL IMAGING LTD·Filed 2021·Granted Sep 23, 2025·0 cites·18 claims
- 2543US12456177B2System and method for digital optical aberration correction and spectral imagingPXE COMPUTATION IMAGING LTD·Filed 2021·Granted Oct 28, 2025·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →