Inventor · disambiguated record
Yau Y. Hung
Also filed as: HUNG YAU Y
6 granted patents·172 citations·filing 1977–1999
86Inventor score
Top patents by PatentIndex Score
6 records- 0189US4139302AMethod and apparatus for interferometric deformation analysisRALPH M GRANT ENGINEERING CONS·Filed 1977·Granted Feb 13, 1979·50 cites·17 claims
- 0285US4887899AApparatus and method for electronic analysis of test objectsHUNG YAU Y·Filed 1987·Granted Dec 19, 1989·59 cites·19 claims
- 0362US5011280AMethod of measuring displacement between points on a test objectHUNG YAU Y·Filed 1989·Granted Apr 30, 1991·22 cites·7 claims
- 0458US5004345ADual-lens shearing interferometerHUNG YAU Y·Filed 1988·Granted Apr 2, 1991·18 cites·7 claims
- 0552US4620223AInterferometric deformation analysis systemIND HOLOGRAPHICS INC·Filed 1984·Granted Oct 28, 1986·12 cites·15 claims
- 0642US6606160B1Nondestructive testing of diffusely reflective objectsFiled 1999·Granted Aug 12, 2003·11 cites·30 claims
Join the waitlist — get patent alerts
Get an alert when Yau Y. Hung files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →