Inventor · disambiguated record
Yasuhiro Kawata
Also filed as: KAWATA YASUHIRO
11 granted patents·243 citations·filing 1985–2016
89Inventor score
Top patents by PatentIndex Score
11 records- 0184US6877118B2Memory testing method and memory testing apparatusADVANTEST CORP·Filed 2001·Granted Apr 5, 2005·42 cites·9 claims
- 0283US5604756ATesting device for concurrently testing a plurality of semiconductor memoriesADVANTEST CORP·Filed 1994·Granted Feb 18, 1997·59 cites·8 claims
- 0383US5237208AApparatus for parallel operation of triport uninterruptable power source devicesNISHIMU DENSHI KOGYO KK·Filed 1991·Granted Aug 17, 1993·63 cites·11 claims
- 0472US4665322AUninterruptible polyphase AC power supplyNISHIMU DENSHI KOGYO KK·Filed 1985·Granted May 12, 1987·62 cites·8 claims
- 0564US8995492B2Semiconductor laser elementMASUI SHINGO·Filed 2012·Granted Mar 31, 2015·2 cites·20 claims
- 0656US9735548B2Semiconductor laser element and semiconductor laser deviceNICHIA CORP·Filed 2016·Granted Aug 15, 2017·0 cites·17 claims
- 0754US9692208B2Method of manufacturing semiconductor deviceNICHIA CORP·Filed 2016·Granted Jun 27, 2017·0 cites·19 claims
- 0853US9553425B2Methods of manufacturing semiconductor laser element and semiconductor laser deviceNICHIA CORP·Filed 2015·Granted Jan 24, 2017·0 cites·17 claims
- 0953US5841783AFail address analysis and repair system for semiconductor testADVANTEST CORP·Filed 1996·Granted Nov 24, 1998·15 cites·1 claims
- 1043US9225146B2Semiconductor laser deviceNICHIA CORP·Filed 2013·Granted Dec 29, 2015·0 cites·26 claims
- 1141US9318874B2Semiconductor device and method of manufacturing semiconductor deviceMICHIUE ATSUO·Filed 2010·Granted Apr 19, 2016·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →