Inventor · disambiguated record
Yasuji Koshikawa
Also filed as: KOSHIKAWA YASUJI
63 granted patents·5 pending applications·951 citations·filing 1992–2020
99Inventor score
Files withNEC CORP42ELPIDA MEMORY INC20MATSUMOTO YASUHIRO2POWERCHIP SEMICONDUCTOR MFG CORP2NODA HIROMASA1
Top patents by PatentIndex Score
68 records- 0198US7551502B2Semiconductor deviceELPIDA MEMORY INC·Filed 2006·Granted Jun 23, 2009·75 cites·8 claims
- 0294US7187607B2Semiconductor memory device and method for manufacturing sameELPIDA MEMORY INC·Filed 2004·Granted Mar 6, 2007·84 cites·9 claims
- 0391US7742356B2Semiconductor memory device having a refresh cycle changing circuitELPIDA MEMORY INC·Filed 2007·Granted Jun 22, 2010·24 cites·8 claims
- 0485US5781499ASemiconductor memory deviceNEC CORP·Filed 1996·Granted Jul 14, 1998·60 cites·12 claims
- 0584US5579267ASemiconductor pipeline memory device eliminating time loss due to difference between pipeline stages from data accessNEC CORP·Filed 1995·Granted Nov 26, 1996·59 cites·11 claims
- 0684US5329168ASemiconductor integrated circuit device equipped with substrate biasing system selectively powered from internal and external power sourcesNEC CORP·Filed 1992·Granted Jul 12, 1994·54 cites·12 claims
- 0782US7215589B2Semiconductor memory device that requires refresh operationsELPIDA MEMORY INC·Filed 2006·Granted May 8, 2007·13 cites·17 claims
- 0878US7301844B2Semiconductor deviceELPIDA MEMORY INC·Filed 2006·Granted Nov 27, 2007·10 cites·7 claims
- 0977US5467468ASemiconductor memory device having built-in test circuits selectively activated by decoder circuitNEC CORP·Filed 1993·Granted Nov 14, 1995·39 cites·14 claims
- 1077US5397984AIntegrated circuit for protecting internal circuitry from high voltage input test signalsNEC CORP·Filed 1993·Granted Mar 14, 1995·39 cites·5 claims
- 1175US6483579B2Clock synchronization semiconductor memory deviceNEC CORP·Filed 2002·Granted Nov 19, 2002·18 cites·11 claims
- 1272US6272057B1Semiconductor memory deviceNEC CORP·Filed 2000·Granted Aug 7, 2001·17 cites·8 claims
- 1370US5287011APower-on detecting circuit desirable for integrated circuit equipped with internal step-down circuitNEC CORP·Filed 1992·Granted Feb 15, 1994·23 cites·10 claims
- 1469US7697360B2Semiconductor deviceELPIDA MEMORY INC·Filed 2009·Granted Apr 13, 2010·5 cites·16 claims
- 1569US5867447ASynchronous semiconductor memory having a write execution time dependent upon a cycle timeNEC CORP·Filed 1996·Granted Feb 2, 1999·28 cites·7 claims
- 1667US6452844B2Semiconductor storage device having redundancy circuit for replacement of defect cells under testsNEC CORP·Filed 2000·Granted Sep 17, 2002·13 cites·21 claims
- 1767US6061294ASynchronous semiconductor memory device and method of controlling sensing process of synchronous dynamic RAMNEC CORP·Filed 1997·Granted May 9, 2000·26 cites·4 claims
- 1867US5319302ASemiconductor integrated circuit device having voltage regulating unit for variable internal power voltage levelNEC CORP·Filed 1992·Granted Jun 7, 1994·25 cites·6 claims
- 1966US6353573B1Clock synchronization semiconductor memory deviceNEC CORP·Filed 2000·Granted Mar 5, 2002·12 cites·8 claims
- 2065US6104224ADelay circuit device having a reduced current consumptionNEC CORP·Filed 1998·Granted Aug 15, 2000·25 cites·8 claims
- 2163US7835213B2Semiconductor memory deviceELPIDA MEMORY INC·Filed 2008·Granted Nov 16, 2010·2 cites·4 claims
- 2263US7613056B2Semiconductor memory deviceELPIDA MEMORY INC·Filed 2008·Granted Nov 3, 2009·4 cites·22 claims
- 2363US6414887B2Semiconductor memory deviceNEC CORP·Filed 2001·Granted Jul 2, 2002·9 cites·4 claims
- 2461US7471586B2Semiconductor memory device which controls refresh of a memory array in normal operationELPIDA MEMORY INC·Filed 2007·Granted Dec 30, 2008·4 cites·9 claims
- 2560US7796456B2Semiconductor deviceELPIDA MEMORY INC·Filed 2006·Granted Sep 14, 2010·4 cites·10 claims
- 2659US8015457B2Redundancy circuit and semiconductor memory deviceELPIDA MEMORY INC·Filed 2007·Granted Sep 6, 2011·6 cites·9 claims
- 2759US6847563B2Semiconductor storage device and method for remedying defects of memory cellsELPIDA MEMORY INC·Filed 2002·Granted Jan 25, 2005·10 cites·13 claims
- 2859US5428299ASemiconductor integrated circuit device having low power consumption voltage monitoring circuit for built-in step-down voltage generatorNEC CORP·Filed 1994·Granted Jun 27, 1995·19 cites·6 claims
- 2958US7082072B2Semiconductor memory device with refreshment controlELPIDA MEMORY INC·Filed 2004·Granted Jul 25, 2006·9 cites·17 claims
- 3058US6515921B2Semiconductor storage device having redundancy circuit for replacement of defect cells under testsNEC CORP·Filed 2002·Granted Feb 4, 2003·8 cites·10 claims
- 3158US6122207ASemiconductor memory device and method for relieving defective memory cellsNEC CORP·Filed 1999·Granted Sep 19, 2000·20 cites·20 claims
- 3258US5270584ASemiconductor integrated circuitNEC CORP·Filed 1992·Granted Dec 14, 1993·18 cites·9 claims
- 3357US8102726B2Semiconductor deviceMATSUMOTO YASUHIRO·Filed 2008·Granted Jan 24, 2012·0 cites·11 claims
- 3457US7940583B2Semiconductor memory device, control method therefor, and method for determining repair possibility of defective addressELPIDA MEMORY INC·Filed 2009·Granted May 10, 2011·3 cites·18 claims
- 3555US7085187B2Semiconductor storage deviceELPIDA MEMORY INC·Filed 2004·Granted Aug 1, 2006·8 cites·18 claims
- 3655US7075852B2Semiconductor memory device of hierarchy word type and sub word driver circuitELPIDA MEMORY INC·Filed 2004·Granted Jul 11, 2006·8 cites·15 claims
- 3755US6385104B2Semiconductor memory device having a test mode decision circuitNEC CORP·Filed 2001·Granted May 7, 2002·8 cites·4 claims
- 3855US5708614AData output control circuit of semiconductor memory device having pipeline structureNEC CORP·Filed 1997·Granted Jan 13, 1998·15 cites·20 claims
- 3955US5463581AMemory in which improvement is made as regards a precharge operation of data readout routesNEC CORP·Filed 1994·Granted Oct 31, 1995·16 cites·6 claims
- 4054US6023433ASemiconductor memory device with a redundant decoder having a small scale in circuitryNEC CORP·Filed 1998·Granted Feb 8, 2000·15 cites·105 claims
- 4152US11094368B2Memory, memory chip and memory data access methodPOWERCHIP SEMICONDUCTOR MFG CORP·Filed 2020·Granted Aug 17, 2021·0 cites·18 claims
- 4252US8411522B2Semiconductor deviceMATSUMOTO YASUHIRO·Filed 2011·Granted Apr 2, 2013·0 cites·33 claims
- 4352US6330198B1Semiconductor storage deviceNEC CORP·Filed 2000·Granted Dec 11, 2001·7 cites·11 claims
- 4451US7652904B2Semiconductor memory device having plural memory cell arraysELPIDA MEMORY INC·Filed 2007·Granted Jan 26, 2010·2 cites·22 claims
- 4550US6636448B2Semiconductor memory device having fewer memory cell plates being activated in a test mode than in a normal modeNEC CORP·Filed 2001·Granted Oct 21, 2003·6 cites·20 claims
- 4650US5901097ARead bus controlling apparatus for semiconductor storage deviceNEC CORP·Filed 1997·Granted May 4, 1999·12 cites·5 claims
- 4749US5361000AReference potential generating circuitNEC CORP·Filed 1992·Granted Nov 1, 1994·9 cites·2 claims
- 4846US11094372B1Partial writing method of dram memoryl device to reduce power consumption associated with large voltage swing of internal input/output linesPOWERCHIP SEMICONDUCTOR MFG CORP·Filed 2020·Granted Aug 17, 2021·0 cites·22 claims
- 4946US5502684ASemiconductor memory having high speed and low power data read/write circuitNEC CORP·Filed 1994·Granted Mar 26, 1996·10 cites·8 claims
- 5045US2014104916A1Semiconductor device having memory cell array divided into plural memory matsNODA HIROMASA·Filed 2013·Application pending·0 cites
Showing the top 50 of 68 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →