Inventor · disambiguated record
Ya Luo
Also filed as: LUO YA
12 granted patents·13 pending applications·79 citations·filing 2011–2025
90Inventor score
Top patents by PatentIndex Score
25 records- 0195US8719347B1Scoring stream items with models based on user interestsTOMKINS ANDREW·Filed 2012·Granted May 6, 2014·34 cites·9 claims
- 0294US8732240B1Scoring stream items with models based on user interestsTOMKINS ANDREW·Filed 2011·Granted May 20, 2014·22 cites·44 claims
- 0393US11561477B2Training methods for machine learning assisted optical proximity error correctionASML NETHERLANDS BV·Filed 2018·Granted Jan 24, 2023·4 cites·20 claims
- 0490US12204250B2Training methods for machine learning assisted optical proximity errorASML NETHERLANDS BV·Filed 2023·Granted Jan 21, 2025·1 cites·20 claims
- 0590US9858275B1Scoring stream items in real timeGOOGLE INC·Filed 2015·Granted Jan 2, 2018·4 cites·21 claims
- 0689US11768440B2Training methods for machine learning assisted optical proximity error correctionASML NETHERLANDS BV·Filed 2022·Granted Sep 26, 2023·1 cites·11 claims
- 0788US9158775B1Scoring stream items in real timeTOMKINS ANDREW·Filed 2011·Granted Oct 13, 2015·6 cites·28 claims
- 0883US9979777B1Scoring stream items with models based on user interestsGOOGLE INC·Filed 2014·Granted May 22, 2018·2 cites·30 claims
- 0982US12399423B2Method for training machine learning model to determine optical proximity correction for maskASML NETHERLANDS BV·Filed 2020·Granted Aug 26, 2025·2 cites·20 claims
- 1080US2025370327A1Method for training machine learning model to determine optical proximity correction for maskASML NETHERLANDS BV·Filed 2025·Application pending·0 cites
- 1174US10996565B2Methods of determining scattering of radiation by structures of finite thicknesses on a patterning deviceASML NETHERLANDS BV·Filed 2018·Granted May 4, 2021·2 cites·20 claims
- 1267US10948831B2Methods of determining process models by machine learningASML NETHERLANDS BV·Filed 2018·Granted Mar 16, 2021·1 cites·22 claims
- 1363US2021271172A1Methods of determining process models by machine learningASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 1459US2025189881A1Lithographic pattern representation with curvilinear elementsASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 1558US12505524B2Method for training or using a process model for determining a pattern in a patterning processASML NETHERLANDS BV·Filed 2020·Granted Dec 23, 2025·0 cites·21 claims
- 1658US2024044922A1Device and methods for measuring platelet-fibrin clot contraction kineticsUNIV KENTUCKY RES FOUND·Filed 2023·Application pending·0 cites
- 1753US2014012672A1Content-based bidding in online advertisingYE JUN·Filed 2012·Application pending·0 cites
- 1853US2014012671A1Content-based targeted online advertisementYE JUN·Filed 2012·Application pending·0 cites
- 1951US2013066716A1Sentiment-targeting for online advertisementCHEN LUOQI·Filed 2011·Application pending·0 cites
- 2051US2013041750A1Method of attention-targeting for online advertisementFOUNTON TECHNOLOGIES LTD·Filed 2011·Application pending·0 cites
- 2145US2022299881A1Methods for improving process based contour information of structure in imageASML NETHERLANDS BV·Filed 2020·Application pending·0 cites
- 2244US2022284344A1Method for training machine learning model for improving patterning processASML NETHERLANDS BV·Filed 2020·Application pending·0 cites
- 2344US2022327364A1Semiconductor device geometry method and systemASML NETHERLANDS BV·Filed 2020·Application pending·0 cites
- 2441US2020380362A1Methods for training machine learning model for computation lithographyASML NETHERLANDS BV·Filed 2019·Application pending·0 cites
- 2540US2020050099A1Assist feature placement based on machine learningASML NETHERLANDS BV·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →