Inventor · disambiguated record
Yasuaki Noda
Also filed as: Noda yasuaki
10 granted patents·1 pending application·10 citations·filing 2011–2023
82Inventor score
Files withTOKYO ELECTRON LTD11
Top patents by PatentIndex Score
11 records- 0183US10381221B2Substrate processing method, substrate processing apparatus and a computer-readable storage mediumTOKYO ELECTRON LTD·Filed 2017·Granted Aug 13, 2019·3 cites·14 claims
- 0282US12501004B2Substrate imaging apparatusTOKYO ELECTRON LTD·Filed 2023·Granted Dec 16, 2025·0 cites·6 claims
- 0377US8356951B2Wet-processing apparatusTOKYO ELECTRON LTD·Filed 2011·Granted Jan 22, 2013·5 cites·17 claims
- 0475US10707109B2Substrate processing apparatusTOKYO ELECTRON LTD·Filed 2018·Granted Jul 7, 2020·2 cites·13 claims
- 0572US11832026B2Substrate imaging apparatusTOKYO ELECTRON LTD·Filed 2021·Granted Nov 28, 2023·0 cites·4 claims
- 0664US10958879B2Substrate imaging apparatusTOKYO ELECTRON LTD·Filed 2019·Granted Mar 23, 2021·0 cites·18 claims
- 0759US11791162B2Processing apparatus for forming a coating film on a substrate having a camera and a mirror memberTOKYO ELECTRON LTD·Filed 2019·Granted Oct 17, 2023·0 cites·9 claims
- 0856US10523905B2Substrate imaging apparatusTOKYO ELECTRON LTD·Filed 2017·Granted Dec 31, 2019·0 cites·12 claims
- 0951US11555691B2Substrate inspection system, substrate inspection method and recording mediumTOKYO ELECTRON LTD·Filed 2020·Granted Jan 17, 2023·0 cites·11 claims
- 1042US11378388B2Substrate inspection method, substrate inspection apparatus and recording mediumTOKYO ELECTRON LTD·Filed 2019·Granted Jul 5, 2022·0 cites·8 claims
- 1142US2022252507A1Substrate processing apparatus, substrate inspecting method, and storage mediumTOKYO ELECTRON LTD·Filed 2020·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →