Inventor · disambiguated record
Yasuyuki Nozuyama
Also filed as: NOZUYAMA YASUYUKI
39 granted patents·1 pending application·600 citations·filing 1988–2013
98Inventor score
Top patents by PatentIndex Score
40 records- 0192US6766473B2Test pattern selection apparatus for selecting test pattern from a plurality of check patternsTOKYO SHIBAURA ELECTRIC CO·Filed 2001·Granted Jul 20, 2004·56 cites·20 claims
- 0288US7406645B2Test pattern generating apparatus, method for automatically generating test patterns and computer program product for executing an application for a test pattern generating apparatusTOSHIBA KK·Filed 2005·Granted Jul 29, 2008·16 cites·20 claims
- 0385US6567946B1Evaluation device of weighted fault coverage and evaluation method of the sameTOSHIBA KK·Filed 2000·Granted May 20, 2003·31 cites·18 claims
- 0484US7283918B2Apparatus for analyzing fault of semiconductor integrated circuit, method for the same, and computer readable medium for the sameTOSHIBA KK·Filed 2006·Granted Oct 16, 2007·13 cites·6 claims
- 0583US5588006ALogic circuit having a control signal switching logic function and having a testing arrangementTOSHIBA KK·Filed 1993·Granted Dec 24, 1996·39 cites·10 claims
- 0679US7096140B2Test system, test method and test program for an integrated circuit by IDDQ testingTOSHIBA KK·Filed 2004·Granted Aug 22, 2006·30 cites·16 claims
- 0778US7392146B2Fault list and test pattern generating apparatus and method, fault list generating and fault coverage calculating apparatus and methodTOSHIBA KK·Filed 2007·Granted Jun 24, 2008·9 cites·20 claims
- 0875US7162674B2Apparatus for selecting test patterns for logic circuit, computer implemented method for selecting test patterns, and computer program product for controlling a computer system so as to select test patternsTOSHIBA KK·Filed 2003·Granted Jan 9, 2007·21 cites·14 claims
- 0971US7093216B2Apparatus connectable to a computer network for circuit design verification, computer implemented method for circuit design verification, and computer program product for controlling a computer system so as to verify circuit designsTOSHIBA KK·Filed 2004·Granted Aug 15, 2006·16 cites·18 claims
- 1065US6151694AMethod of evaluating fault coverageTOSHIBA KK·Filed 1998·Granted Nov 21, 2000·26 cites·20 claims
- 1164US7966138B2Apparatus for creating test pattern and calculating fault coverage or the like and method for creating test pattern and calculating fault coverage or the likeTOSHIBA KK·Filed 2008·Granted Jun 21, 2011·4 cites·20 claims
- 1264US5867409ALinear feedback shift registerTOSHIBA KK·Filed 1997·Granted Feb 2, 1999·43 cites·19 claims
- 1363US8508249B2Semiconductor integrated circuit and method for designing the sameNOZUYAMA YASUYUKI·Filed 2011·Granted Aug 13, 2013·1 cites·14 claims
- 1463US8082534B2Apparatus and method for calculating fault coverage, and fault detection methodNOZUYAMA YASUYUKI·Filed 2006·Granted Dec 20, 2011·4 cites·19 claims
- 1563US8051403B2Delay fault test quality calculation apparatus, delay fault test quality calculation method, and delay fault test pattern generation apparatusTOSHIBA KK·Filed 2007·Granted Nov 1, 2011·3 cites·11 claims
- 1662US7139956B2Semiconductor integrated circuit device and test method thereofTOSHIBA KK·Filed 2004·Granted Nov 21, 2006·10 cites·10 claims
- 1761US6223312B1Test-facilitating circuit for information processing devicesTOSHIBA KK·Filed 1994·Granted Apr 24, 2001·35 cites·4 claims
- 1861US5677916ASemiconductor integrated circuit and its application deviceTOSHIBA KK·Filed 1996·Granted Oct 14, 1997·22 cites·10 claims
- 1960US7308660B2Calculation system of fault coverage and calculation method of the sameTOSHIBA KK·Filed 2004·Granted Dec 11, 2007·7 cites·20 claims
- 2058US6834368B2Semiconductor integrated circuit including a test facilitation circuit for functional blocks intellectual properties and automatic insertion method of the same test facilitation circuitTOSHIBA KK·Filed 2001·Granted Dec 21, 2004·8 cites·14 claims
- 2158US5202978ASelf-test circuit of information processorTOSHIBA KK·Filed 1989·Granted Apr 13, 1993·23 cites·9 claims
- 2256US7913143B2Test quality evaluating and improving system for semiconductor integrated circuit and test quality evaluation and improvement method for semiconductor integrated circuitTOSHIBA KK·Filed 2009·Granted Mar 22, 2011·2 cites·20 claims
- 2356US5504755ATestable programmable logic arrayTOSHIBA KK·Filed 1992·Granted Apr 2, 1996·18 cites·8 claims
- 2454US9075946B2Method for designing semiconductor integrated circuitTOSHIBA KK·Filed 2013·Granted Jul 7, 2015·0 cites·6 claims
- 2554US7082559B2Semiconductor integrated circuit device and test method thereofTOSHIBA KK·Filed 2002·Granted Jul 25, 2006·7 cites·11 claims
- 2654US5821786ASemiconductor integrated circuit having function for evaluating AC performanceTOSHIBA KK·Filed 1997·Granted Oct 13, 1998·16 cites·17 claims
- 2753US5189675ASelf-diagnostic circuit for logic circuit blockTOSHIBA KK·Filed 1992·Granted Feb 23, 1993·16 cites·5 claims
- 2852US5631910AInformation processing system provided with self-diagnosing circuit and the self-diagnosing method thereforTOSHIBA KK·Filed 1994·Granted May 20, 1997·24 cites·12 claims
- 2949US5184067ASignature compression circuitTOSHIBA KK·Filed 1991·Granted Feb 2, 1993·20 cites·8 claims
- 3049US4965511ATest circuit for logic ICSTOSHIBA KK·Filed 1989·Granted Oct 23, 1990·10 cites·4 claims
- 3147US5862359AData transfer bus including divisional buses connectable by bus switch circuitTOSHIBA KK·Filed 1996·Granted Jan 19, 1999·19 cites·10 claims
- 3246US5592494ACurrent reduction circuit for testing purposeTOSHIBA KK·Filed 1993·Granted Jan 7, 1997·9 cites·20 claims
- 3346US5398250ACircuit for testing circuit blocks controlled by microinstructionsTOSHIBA KK·Filed 1994·Granted Mar 14, 1995·17 cites·11 claims
- 3444US8185863B2Delay fault test quality calculation apparatus, delay fault test quality calculation method, and delay fault test pattern generation apparatusNOZUYAMA YASUYUKI·Filed 2011·Granted May 22, 2012·0 cites·5 claims
- 3544US6101623ACurrent reduction circuit for testing purposeTOSHIBA KK·Filed 1997·Granted Aug 8, 2000·7 cites·6 claims
- 3642US8886487B2Bridge fault removal apparatus, bridge fault removal method, and computer readable medium comprising computer program code for removing bridge faultNOZUYAMA YASUYUKI·Filed 2010·Granted Nov 11, 2014·0 cites·15 claims
- 3739US6148434AApparatus and method for minimizing the delay times in a semiconductor deviceTOSHIBA KK·Filed 1997·Granted Nov 14, 2000·10 cites·6 claims
- 3835US2005182587A1Circuit quality evaluation method and apparatus, circuit quality evaluation program, and medium having the program recorded thereonSEMICONDUCTOR TECH ACAD RES CT·Filed 2005·Application pending·0 cites
- 3934US5515517AData processing device with test circuitTOSHIBA KK·Filed 1994·Granted May 7, 1996·5 cites·3 claims
- 4034US4902918AProgrammable logic arrays with each array column divided into a plurality of series connections of FETsTOSHIBA KK·Filed 1988·Granted Feb 20, 1990·3 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →