Inventor · disambiguated record
Yasutaka Toyoda
Also filed as: TOYODA YASUTAKA
62 granted patents·19 pending applications·308 citations·filing 2000–2025
98Inventor score
Top patents by PatentIndex Score
81 records- 0194US7923703B2Sample dimension inspecting/measuring method and sample dimension inspecting/measuring apparatusHITACHI HIGH TECH CORP·Filed 2007·Granted Apr 12, 2011·18 cites·13 claims
- 0291US7732792B2Pattern measurement apparatusHITACHI HIGH TECH CORP·Filed 2008·Granted Jun 8, 2010·23 cites·5 claims
- 0390US7507961B2Method and apparatus of pattern inspection and semiconductor inspection system using the sameHITACHI HIGH TECH CORP·Filed 2006·Granted Mar 24, 2009·18 cites·23 claims
- 0489US11587225B2Pattern inspection systemHITACHI HIGH TECH CORP·Filed 2021·Granted Feb 21, 2023·2 cites·9 claims
- 0588US10558127B2Exposure condition evaluation deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Feb 11, 2020·4 cites·18 claims
- 0688US9858659B2Pattern inspecting and measuring device and programHITACHI HIGH TECH CORP·Filed 2013·Granted Jan 2, 2018·9 cites·16 claims
- 0787US10937146B2Image evaluation method and image evaluation deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Mar 2, 2021·5 cites·18 claims
- 0886US11132788B2Pattern inspection systemHITACHI HIGH TECH CORP·Filed 2019·Granted Sep 28, 2021·6 cites·19 claims
- 0986US7230243B2Method and apparatus for measuring three-dimensional shape of specimen by using SEMHITACHI HIGH TECH CORP·Filed 2005·Granted Jun 12, 2007·9 cites·15 claims
- 1084US8515155B2Pattern generating apparatus and pattern shape evaluating apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Aug 20, 2013·5 cites·16 claims
- 1184US8445871B2Pattern measurement apparatusMATSUOKA RYOICHI·Filed 2010·Granted May 21, 2013·6 cites·16 claims
- 1284US8217351B2Pattern inspection method and pattern inspection systemTOYODA YASUTAKA·Filed 2010·Granted Jul 10, 2012·6 cites·6 claims
- 1384US8077962B2Pattern generating apparatus and pattern shape evaluating apparatusTOYODA YASUTAKA·Filed 2009·Granted Dec 13, 2011·9 cites·44 claims
- 1483US7786437B2Pattern inspection method and pattern inspection systemHITACHI HIGH TECH CORP·Filed 2008·Granted Aug 31, 2010·7 cites·20 claims
- 1582US8577124B2Method and apparatus of pattern inspection and semiconductor inspection system using the sameTOYODA YASUTAKA·Filed 2012·Granted Nov 5, 2013·5 cites·10 claims
- 1682US7369284B1Image signal processing method, image signal processing device, and image signal processing systemRICOH PRINTING SYS LTD·Filed 2000·Granted May 6, 2008·24 cites·3 claims
- 1781US9846931B2Pattern sensing device and semiconductor sensing systemHITACHI HIGH TECH CORP·Filed 2013·Granted Dec 19, 2017·5 cites·15 claims
- 1881US8338804B2Sample dimension inspecting/measuring method and sample dimension inspecting/measuring apparatusMOROKUMA HIDETOSHI·Filed 2011·Granted Dec 25, 2012·6 cites·15 claims
- 1981US7925076B2Inspection apparatus using template matching method using similarity distributionHITACHI HIGH TECH CORP·Filed 2007·Granted Apr 12, 2011·13 cites·20 claims
- 2079US9396620B2Money handling machine, money handling system, money handling method and valuable-medium handling machineTAKAYAMA ATSUSHI·Filed 2012·Granted Jul 19, 2016·5 cites·12 claims
- 2179US7978904B2Pattern inspection apparatus and semiconductor inspection systemHITACHI HIGH TECH CORP·Filed 2007·Granted Jul 12, 2011·9 cites·15 claims
- 2279US2025371853A1System for Generating Image, and Non-Transitory Computer-Readable MediumHITACHI HIGH TECH CORP·Filed 2025·Application pending·0 cites
- 2378US8498489B2Image inspection apparatusABE YUICHI·Filed 2009·Granted Jul 30, 2013·14 cites·6 claims
- 2478US8115169B2Method and apparatus of pattern inspection and semiconductor inspection system using the sameTOYODA YASUTAKA·Filed 2009·Granted Feb 14, 2012·3 cites·7 claims
- 2577US6784891B2Image display systemHITACHI LTD·Filed 2001·Granted Aug 31, 2004·14 cites·13 claims
- 2676US8041104B2Pattern matching apparatus and scanning electron microscope using the sameHITACHI HIGH TECH CORP·Filed 2005·Granted Oct 18, 2011·12 cites·25 claims
- 2775US10317203B2Dimension measuring apparatus and computer readable mediumHITACHI HIGH TECH CORP·Filed 2013·Granted Jun 11, 2019·4 cites·9 claims
- 2875US9990708B2Pattern-measuring apparatus and semiconductor-measuring systemHITACHI HIGH TECH CORP·Filed 2014·Granted Jun 5, 2018·3 cites·5 claims
- 2975US8355562B2Pattern shape evaluation methodHITACHI HIGH TECH CORP·Filed 2008·Granted Jan 15, 2013·9 cites·19 claims
- 3075US2024404043A1Image Processing Program, Image Processing Device, and Image Processing MethodHITACHI HIGH TECH CORP·Filed 2024·Application pending·0 cites
- 3174US8653456B2Pattern inspection method, pattern inspection program, and electronic device inspection systemTOYODA YASUTAKA·Filed 2011·Granted Feb 18, 2014·3 cites·18 claims
- 3274US7151619B2Image formation apparatusHITACHI LTD·Filed 2002·Granted Dec 19, 2006·11 cites·14 claims
- 3374US6700680B2Image formation apparatusHITACHI LTD·Filed 2002·Granted Mar 2, 2004·11 cites·2 claims
- 3473US8363923B2Pattern generating apparatus and pattern shape evaluating apparatusHITACHI HIGH TECH CORP·Filed 2011·Granted Jan 29, 2013·2 cites·10 claims
- 3572US7991218B2Pattern matching apparatus and semiconductor inspection system using the sameHITACHI HIGH TECH CORP·Filed 2006·Granted Aug 2, 2011·6 cites·20 claims
- 3671US10445875B2Pattern-measuring apparatus and semiconductor-measuring systemHITACHI HIGH TECH CORP·Filed 2018·Granted Oct 15, 2019·1 cites·7 claims
- 3769US11836906B2Image processing system and computer program for performing image processingHITACHI HIGH TECH CORP·Filed 2021·Granted Dec 5, 2023·0 cites·6 claims
- 3869US7084850B2Image display system and image information transmission methodHITACHI LTD·Filed 2001·Granted Aug 1, 2006·7 cites·16 claims
- 3968US8655050B2Pattern generating apparatus and pattern shape evaluating apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Feb 18, 2014·1 cites·13 claims
- 4067US11176405B2Image processing system and computer program for performing image processingHITACHI HIGH TECH CORP·Filed 2018·Granted Nov 16, 2021·1 cites·11 claims
- 4164US12243711B2Method, apparatus, and program for determining condition related to captured image of charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2022·Granted Mar 4, 2025·0 cites·28 claims
- 4264US6992676B2Image display systemHITACHI LTD·Filed 2004·Granted Jan 31, 2006·6 cites·4 claims
- 4363US10643326B2Semiconductor measurement apparatus and computer programHITACHI HIGH TECH CORP·Filed 2013·Granted May 5, 2020·1 cites·10 claims
- 4463US8867818B2Method of creating template for matching, as well as device for creating templateMATSUOKA RYOICHI·Filed 2010·Granted Oct 21, 2014·1 cites·12 claims
- 4562US8577125B2Method and apparatus for image generationSHINODA SHINICHI·Filed 2008·Granted Nov 5, 2013·3 cites·13 claims
- 4660US12423962B2System for generating image, and non-transitory computer-readable mediumHITACHI HIGH TECH CORP·Filed 2020·Granted Sep 23, 2025·0 cites·21 claims
- 4760US12400383B2Training method for learning apparatus, and image generation systemHITACHI HIGH TECH CORP·Filed 2022·Granted Aug 26, 2025·0 cites·17 claims
- 4857US12394038B2Image processing program, image processing device, and image processing methodHITACHI HIGH TECH CORP·Filed 2019·Granted Aug 19, 2025·0 cites·18 claims
- 4957US9495844B2Money handling machine, money handling system and money handling methodGLORY KOGYO KK·Filed 2013·Granted Nov 15, 2016·0 cites·4 claims
- 5053US12014530B2Image recognition device and methodHITACHI HIGH TECH CORP·Filed 2018·Granted Jun 18, 2024·0 cites·26 claims
Showing the top 50 of 81 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →