Inventor · disambiguated record
Yasuo Tsukuda
Also filed as: TSUKUDA YASUO
22 granted patents·337 citations·filing 1979–2019
96Inventor score
Top patents by PatentIndex Score
22 records- 0192US7438627B2Polishing state monitoring methodEBARA CORP·Filed 2007·Granted Oct 21, 2008·17 cites·6 claims
- 0291US7645181B2Polishing state monitoring apparatus and polishing apparatusEBARA CORP·Filed 2008·Granted Jan 12, 2010·13 cites·13 claims
- 0391US7252575B2Polishing state monitoring apparatus and polishing apparatus and methodSHIMADZU CORP·Filed 2003·Granted Aug 7, 2007·44 cites·18 claims
- 0489US8049884B2SpectrophotometerSHIMADZU CORP·Filed 2007·Granted Nov 1, 2011·14 cites·8 claims
- 0589US7576855B2Spectrophotometric method and apparatusSHIMADZU CORP·Filed 2006·Granted Aug 18, 2009·19 cites·15 claims
- 0688US4808490APlasma sprayed film resistor heaterHITACHI METALS LTD·Filed 1986·Granted Feb 28, 1989·54 cites·2 claims
- 0786US6758723B2Substrate polishing apparatusEBARA CORP·Filed 2002·Granted Jul 6, 2004·20 cites·8 claims
- 0880US4306908AFerromagnetic amorphous alloyHITACHI LTD·Filed 1980·Granted Dec 22, 1981·20 cites·11 claims
- 0978US7585204B2Substrate polishing apparatusEBARA CORP·Filed 2009·Granted Sep 8, 2009·4 cites·7 claims
- 1078US6942543B2Substrate polishing apparatusSHIMADZU CORP·Filed 2004·Granted Sep 13, 2005·12 cites·10 claims
- 1177US7241202B2Substrate polishing apparatusSHIMADZU CORP·Filed 2005·Granted Jul 10, 2007·4 cites·10 claims
- 1275US8342907B2Polishing state monitoring methodEBARA CORP·Filed 2009·Granted Jan 1, 2013·3 cites·9 claims
- 1371US5422483ANear infrared analyzerSHIMADZU CORP·Filed 1993·Granted Jun 6, 1995·40 cites·20 claims
- 1471US4715178AExhaust port assemblyHITACHI METALS LTD·Filed 1984·Granted Dec 29, 1987·20 cites·5 claims
- 1568US4259101AMethod for producing optical fiber preformHITACHI LTD·Filed 1979·Granted Mar 31, 1981·15 cites·10 claims
- 1663US7547242B2Substrate polishing apparatusEBARA CORP·Filed 2004·Granted Jun 16, 2009·7 cites·18 claims
- 1762US4733088ARadiation detectorHITACHI LTD·Filed 1986·Granted Mar 22, 1988·14 cites·9 claims
- 1853US7510460B2Substrate polishing apparatusEBARA CORP·Filed 2007·Granted Mar 31, 2009·0 cites·4 claims
- 1952US7101257B2Substrate polishing apparatusSHIMADZU CORP·Filed 2003·Granted Sep 5, 2006·3 cites·4 claims
- 2048US12163885B2Analysis device, analysis method, trace liquid collection device, and trace liquid collection methodSHIMADZU CORP·Filed 2019·Granted Dec 10, 2024·0 cites·11 claims
- 2146US7830520B2Optical measurement device for trace liquid sampleSHIMADZU CORP·Filed 2006·Granted Nov 9, 2010·0 cites·13 claims
- 2245US5731594AInfrared light sourceSHIMADZU CORP·Filed 1996·Granted Mar 24, 1998·14 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →