Inventor · disambiguated record
Yaniv Weiss
Also filed as: WEISS YANIV
2 granted patents·1 pending application·0 citations·filing 2023–2024
22Inventor score
Files withKLA CORP3
Top patents by PatentIndex Score
3 records- 0163US12373936B2System and method for overlay metrology using a phase maskKLA CORP·Filed 2023·Granted Jul 29, 2025·0 cites·38 claims
- 0263US2025306477A1Single grab pupil landscape via outside the objective lens broadband illuminationKLA CORP·Filed 2024·Application pending·0 cites
- 0360US12504697B2Single grab pupil landscape via broadband illuminationKLA CORP·Filed 2023·Granted Dec 23, 2025·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →