Inventor · disambiguated record
Yasuhito Yamamoto
Also filed as: YAMAMOTO YASUHITO
8 granted patents·35 citations·filing 2008–2011
83Inventor score
Top patents by PatentIndex Score
8 records- 0188US7701236B2Each inspection units of a probe apparatus is provided with an imaging unit to take an image of a waferTOKYO ELECTRON LTD·Filed 2008·Granted Apr 20, 2010·16 cites·17 claims
- 0275US7812627B2Test deviceTOKYO ELECTRON LTD·Filed 2008·Granted Oct 12, 2010·5 cites·19 claims
- 0370US8081007B2Inspection apparatus and method for inspecting electric characteristics of devices formed on target objectYAMAMOTO YASUHITO·Filed 2008·Granted Dec 20, 2011·4 cites·6 claims
- 0469US8294480B2Inspection apparatus having alignment mechanismSUZUKI MASARU·Filed 2008·Granted Oct 23, 2012·3 cites·12 claims
- 0565US7859283B2Probe apparatus, probing method, and storage mediumTOKYO ELECTRON LTD·Filed 2009·Granted Dec 28, 2010·2 cites·13 claims
- 0660US7724007B2Probe apparatus and probing methodTOKYO ELECTRON LTD·Filed 2008·Granted May 25, 2010·4 cites·13 claims
- 0759US8726748B2Probe apparatus and substrate transfer methodOBIKANE TADASHI·Filed 2010·Granted May 20, 2014·1 cites·9 claims
- 0843US8536891B2Inspection method for inspecting electric characteristics of devices formed on target objectYAMAMOTO YASUHITO·Filed 2011·Granted Sep 17, 2013·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →