Inventor · disambiguated record
Yasuro Yoshimitsu
Also filed as: YOSHIMITSU YASURO
5 granted patents·532 citations·filing 1981–1991
87Inventor score
Technology areasG01R
Top patents by PatentIndex Score
5 records- 0196US4523144AComplex probe card for testing a semiconductor waferJAPAN ELECTRONIC MATERIALS·Filed 1981·Granted Jun 11, 1985·118 cites·1 claims
- 0293US4567433AComplex probe card for testing a semiconductor waferNIHON DENSHI ZAIRO KABUSHIKI K·Filed 1984·Granted Jan 28, 1986·141 cites·1 claims
- 0392US5134365AProbe card in which contact pressure and relative position of each probe end are correctly maintainedNIHON DENSHIZAIRYO KK·Filed 1991·Granted Jul 28, 1992·115 cites·1 claims
- 0490US5055778AProbe card in which contact pressure and relative position of each probe end are correctly maintainedNIHON DENSHIZAIRYO KK·Filed 1990·Granted Oct 8, 1991·97 cites·1 claims
- 0588US4518914ATesting apparatus of semiconductor wafersJAPAN ELECTRONIC MATERIALS·Filed 1982·Granted May 21, 1985·61 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →