Inventor · disambiguated record
Ying-Mei Lin
Also filed as: LIN YING-MEI
2 granted patents·9 citations·filing 2008–2012
56Inventor score
Technology areasB24B
Files withLEE SHEN-NAN2
Top patents by PatentIndex Score
2 records- 0182US9132523B2Chemical mechanical polish process control for improvement in within-wafer thickness uniformityLEE SHEN-NAN·Filed 2012·Granted Sep 15, 2015·5 cites·20 claims
- 0271US8129279B2Chemical mechanical polish process control for improvement in within-wafer thickness uniformityLEE SHEN-NAN·Filed 2008·Granted Mar 6, 2012·4 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →