Inventor · disambiguated record
Yi-Hui Tseng
Also filed as: TSENG YI-HUI
1 granted patent·1 pending application·0 citations·filing 2015–2020
7Inventor score
Files withUNITED MICROELECTRONICS CORP2
Top patents by PatentIndex Score
2 records- 0141US11644427B2Automatic detection method and automatic detection system for detecting crack on wafer edgesUNITED MICROELECTRONICS CORP·Filed 2020·Granted May 9, 2023·0 cites·19 claims
- 0229US2016274570A1Method of virtual metrology using combined modelsUNITED MICROELECTRONICS CORP·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →