Inventor · disambiguated record
Yixiang Wang
Also filed as: WANG YIXIANG
32 granted patents·9 pending applications·27 citations·filing 2007–2024
94Inventor score
Files withASML NETHERLANDS BV29BLACK P2 USA INC2WANG YIXIANG2ASML NETHERIANDS B V1BEIJING WEITEXING TECH CO LTD1
Top patents by PatentIndex Score
41 records- 0195US11728131B2Thermal-aided inspection by advanced charge controller module in a charged particle systemASML NETHERLANDS BV·Filed 2021·Granted Aug 15, 2023·2 cites·15 claims
- 0290US10784077B2Systems and methods for charged particle flooding to enhance voltage contrast defect signalASML NETHERLANDS BV·Filed 2018·Granted Sep 22, 2020·5 cites·19 claims
- 0385US12494342B2Systems and methods for charged particle flooding to enhance voltage contrast defect signalASML NETHERLANDS BV·Filed 2024·Granted Dec 9, 2025·0 cites·18 claims
- 0485US11183360B2Optical system with compensation lensASML NETHERLANDS BV·Filed 2018·Granted Nov 23, 2021·2 cites·15 claims
- 0582US12125669B2Thermal-aided inspection by advanced charge controller module in a charged particle systemASML NETHERLANDS BV·Filed 2023·Granted Oct 22, 2024·0 cites·20 claims
- 0679US2024369356A1Inspection apparatus and methodASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 0776US8275436B2Method and apparatus for non-invasive fetal oximetryWANG YIXIANG·Filed 2010·Granted Sep 25, 2012·17 cites·19 claims
- 0876US2024044820A1Methods of inspecting samples with a beam of charged particlesASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 0975US12028000B2Object table comprising an electrostatic clampASML NETHERLANDS BV·Filed 2023·Granted Jul 2, 2024·0 cites·16 claims
- 1073US12087542B2Image contrast enhancement in sample inspectionASML NETHERLANDS BV·Filed 2021·Granted Sep 10, 2024·0 cites·20 claims
- 1172US11682538B2Optical system with compensation lensASML NETHERLANDS BV·Filed 2021·Granted Jun 20, 2023·0 cites·20 claims
- 1272US2025037966A1Self-differential confocal tilt sensor for measuring level variation in charged particle beam systemASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 1371US12072181B2Inspection apparatus and methodASML NETHERLANDS BV·Filed 2021·Granted Aug 27, 2024·0 cites·20 claims
- 1471US11929232B2Systems and methods for charged particle flooding to enhance voltage contrast defect signalASML NETHERLANDS BV·Filed 2020·Granted Mar 12, 2024·0 cites·14 claims
- 1567US11815473B2Methods of inspecting samples with multiple beams of charged particlesASML NETHERLANDS BV·Filed 2020·Granted Nov 14, 2023·0 cites·20 claims
- 1667US11637512B2Object table comprising an electrostatic clampASML NETHERLANDS BV·Filed 2021·Granted Apr 25, 2023·0 cites·16 claims
- 1767US2024371599A1Method, apparatus, and system for wafer groundingASML NETHERIANDS B V·Filed 2024·Application pending·0 cites
- 1866US12142451B2System for inspecting and grounding a mask in a charged particle systemASML NETHERLANDS BV·Filed 2020·Granted Nov 12, 2024·0 cites·22 claims
- 1965US9177758B2Charged particle beam apparatusHERMES MICROVISION INC·Filed 2014·Granted Nov 3, 2015·1 cites·23 claims
- 2064US12451324B2Leveling sensor in multiple charged-particle beam inspectionASML NETHERLANDS BV·Filed 2021·Granted Oct 21, 2025·0 cites·19 claims
- 2164US12217927B2Beam manipulation of advanced charge controller module in a charged particle systemASML NETHERLANDS BV·Filed 2020·Granted Feb 4, 2025·0 cites·18 claims
- 2263US12368067B2Method, apparatus, and system for dynamically controlling an electrostatic chuck during an inspection of waferASML NETHERLANDS BV·Filed 2021·Granted Jul 22, 2025·0 cites·20 claims
- 2361US12142456B2Self-differential confocal tilt sensor for measuring level variation in charged particle beam systemASML NETHERLANDS BV·Filed 2020·Granted Nov 12, 2024·0 cites·15 claims
- 2461US11164719B2Image contrast enhancement in sample inspectionASML NETHERLANDS BV·Filed 2018·Granted Nov 2, 2021·0 cites·13 claims
- 2561US2023326369A1Method and apparatus for generating sign language video, computer device, and storage mediumTENCENT TECH SHENZHEN CO LTD·Filed 2023·Application pending·0 cites
- 2658US12051562B2Method, apparatus, and system for wafer groundingASML NETHERLANDS BV·Filed 2020·Granted Jul 30, 2024·0 cites·10 claims
- 2756US11562884B2Current source apparatus and methodASML NETHERLANDS BV·Filed 2020·Granted Jan 24, 2023·0 cites·15 claims
- 2855US10994997B2Device and method for industrialized continuous production of black phosphorusBLACK P2 USA INC·Filed 2019·Granted May 4, 2021·0 cites·6 claims
- 2955US10968102B2Method for producing black phosphorusBLACK P2 USA INC·Filed 2019·Granted Apr 6, 2021·0 cites·1 claims
- 3053US11808930B2Optical objective lensASML NETHERLANDS BV·Filed 2018·Granted Nov 7, 2023·0 cites·15 claims
- 3153US2010183542A1Synergism Between Activated Immune Cells and Conventional Cancer TherapiesUNIV SOUTH ALABAMA·Filed 2007·Application pending·0 cites
- 3252US12392732B2Multi-source illumination unit and method of operating the sameASML NETHERLANDS BV·Filed 2019·Granted Aug 19, 2025·0 cites·19 claims
- 3352US11581161B2Systems and methods for etching a substrateASML NETHERLANDS BV·Filed 2019·Granted Feb 14, 2023·0 cites·15 claims
- 3452US11482399B2Method and apparatus for an advanced charged controller for wafer inspectionASML NETHERLANDS BV·Filed 2018·Granted Oct 25, 2022·0 cites·17 claims
- 3549US11521826B2Optical height detection systemASML NETHERLANDS BV·Filed 2018·Granted Dec 6, 2022·0 cites·15 claims
- 3648US2022375715A1Charged particle inspection system and method using multi-wavelength charge controllersASML NETHERLANDS BV·Filed 2020·Application pending·0 cites
- 3739US10379659B2Method and apparatus for generating a personalized input panelBaidu online network technology beijing co ltd·Filed 2014·Granted Aug 13, 2019·0 cites·17 claims
- 3839US2011217379A1Magnetic nanomaterials and methods for chemoembolisationDAVIS LLP·Filed 2011·Application pending·0 cites
- 3937US2012226136A1Methods and devices of detection, grading, monitoring, and follow-up of fibrosisWANG YIXIANG·Filed 2012·Application pending·0 cites
- 4036US11006869B2Trans-abdominal non-invasive fetal blood oxygen saturation detection deviceBEIJING WEITEXING TECH CO LTD·Filed 2018·Granted May 18, 2021·0 cites·18 claims
- 4120USD1044531SSafety laser radarSHANGHAI ENABLE YOU TECH CO LTD·Filed 2023·Granted Oct 1, 2024·0 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →