Inventor · disambiguated record
Yong-Bok An
Also filed as: AN YONG B · AN YONG BOK
23 granted patents·3 pending applications·103 citations·filing 2004–2012
94Inventor score
Top patents by PatentIndex Score
26 records- 0186US8456913B2Semiconductor memory apparatus and method for controlling programming current pulseAN YONG BOK·Filed 2010·Granted Jun 4, 2013·11 cites·18 claims
- 0284US7379376B2Internal address generatorHYNIX SEMICONDUCTOR INC·Filed 2006·Granted May 27, 2008·14 cites·25 claims
- 0381US7388799B2Semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Jun 17, 2008·13 cites·20 claims
- 0470US7522467B2Semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Apr 21, 2009·7 cites·25 claims
- 0569US7065000B2Semiconductor memory device capable of stably setting mode register set and method thereforHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Jun 20, 2006·7 cites·8 claims
- 0666US7312627B2Decoding circuit for on die termination in semiconductor memory device and its methodHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Dec 25, 2007·14 cites·17 claims
- 0763US7352230B2Internal voltage trimming circuit for use in semiconductor memory device and method thereofHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Apr 1, 2008·13 cites·28 claims
- 0860US8456933B2Semiconductor memory apparatus and method for generating programming current pulseAN YONG BOK·Filed 2010·Granted Jun 4, 2013·2 cites·19 claims
- 0960US8456932B2Semiconductor memory apparatusAN YONG BOK·Filed 2010·Granted Jun 4, 2013·2 cites·33 claims
- 1060US8374023B2Semiconductor memory apparatusSK HYNIX INC·Filed 2010·Granted Feb 12, 2013·2 cites·34 claims
- 1159US7441156B2Semiconductor memory device having advanced test modeHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Oct 21, 2008·3 cites·8 claims
- 1257US7321991B2Semiconductor memory device having advanced test modeHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Jan 22, 2008·8 cites·11 claims
- 1353US8891320B2Semiconductor memory apparatus, and divisional program control circuit and program method thereforAN YONG BOK·Filed 2012·Granted Nov 18, 2014·1 cites·28 claims
- 1450US7719340B2Internal voltage trimming circuit for use in a semiconductor memory device and method thereofHYNIX SEMICONDUCTOR INC·Filed 2008·Granted May 18, 2010·2 cites·20 claims
- 1547US8127069B2Memory device including self-ID informationAN YONG BOK·Filed 2007·Granted Feb 28, 2012·1 cites·8 claims
- 1643US7321949B2Memory device including self-ID informationHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Jan 22, 2008·3 cites·6 claims
- 1741US2008192552A1Internal address generatorHYNIX SEMICONDUCTOR INC·Filed 2008·Application pending·0 cites
- 1839US8817532B2Semiconductor memory apparatus, and set program control circuit and program method thereforAN YONG BOK·Filed 2012·Granted Aug 26, 2014·0 cites·28 claims
- 1939US8605522B2Semiconductor memory apparatus, and successive program control circuit and program method thereforAN YONG BOK·Filed 2012·Granted Dec 10, 2013·0 cites·29 claims
- 2038US8027190B2Command processing circuit and phase change memory device using the sameHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Sep 27, 2011·0 cites·26 claims
- 2138US7263008B2Semiconductor memory device for securing a stable operation at a high speed operationHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Aug 28, 2007·0 cites·12 claims
- 2237US2008018384A1Internal voltage generating apparatus and method for semiconductor integrated circuitHYNIX SEMICONDUCTOR INC·Filed 2007·Application pending·0 cites
- 2336US7616521B2Semiconductor memory device selectively enabling address buffer according to data outputHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Nov 10, 2009·0 cites·11 claims
- 2435US8570794B2Semiconductor memory apparatusAN YONG BOK·Filed 2010·Granted Oct 29, 2013·0 cites·16 claims
- 2533US7184357B2Decoding circuit for memory deviceHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Feb 27, 2007·0 cites·8 claims
- 2620US2012081982A1Verifying a data path in a semiconductor apparatusYI JAE UNG·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →