Inventor · disambiguated record
Yong-Min Cho
Also filed as: CHO YONG · CHO YONG M · CHO YONG-MIN
13 granted patents·7 pending applications·49 citations·filing 2003–2020
89Inventor score
Files withSAMSUNG ELECTRONICS CO LTD7CHO YONG M2CHO YONG-MIN2MENTOR TECHNOLOGIES INC2BYUN JUNG-HOON1
Top patents by PatentIndex Score
20 records- 0192US9093378B2Method for forming patterns of semiconductor device using SADP processSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Jul 28, 2015·15 cites·15 claims
- 0290US9525036B2Semiconductor device having gate electrode with spacers on fin structure and silicide layer filling the recessSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Dec 20, 2016·8 cites·15 claims
- 0385US9570434B2Semiconductor device and fabricating method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Feb 14, 2017·3 cites·20 claims
- 0475US12020558B2Work zone alert system and methodGEORGIA TECH RES INST·Filed 2020·Granted Jun 25, 2024·2 cites·20 claims
- 0575US7315611B2X-ray reflector exhibiting taper, method of making same, narrow band x-ray filters including same, devices including such filters, multispectral x-ray production via unispectral filter, and multispectral x-ray production via multispectral filterMONOCHROMATIC X RAY TECHNOLOGI·Filed 2005·Granted Jan 1, 2008·9 cites·29 claims
- 0675US7281879B2Portable flood-barriers systemMENTOR TECHNOLOGIES INC·Filed 2005·Granted Oct 16, 2007·6 cites·12 claims
- 0768US9418896B2Semiconductor device and fabricating method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Aug 16, 2016·1 cites·20 claims
- 0862USRE49525ESemiconductor device having gate electrode with spacers on fin structure and silicide layer filling the recessSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted May 9, 2023·0 cites·20 claims
- 0962US8952716B2Method of detecting defects in a semiconductor device and semiconductor device using the sameCHO YONG MIN·Filed 2012·Granted Feb 10, 2015·2 cites·18 claims
- 1057US9991259B2Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Jun 5, 2018·0 cites·11 claims
- 1144US9773869B2Semiconductor device and method of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Sep 26, 2017·0 cites·8 claims
- 1243US2004234340A1Mobile levee systemFiled 2003·Application pending·0 cites
- 1341US7321654B2Narrow band x-ray system and fabrication method thereofMENTOR TECHNOLOGIES INC·Filed 2004·Granted Jan 22, 2008·3 cites·24 claims
- 1440US2007274448A1X-ray reflector exhibiting taper, method of making same, narrow band x-ray filters including same, devices including such filters, multispectral x-ray production via unispectral filter, and multispectral x-ray production via multispectral filterCHO YONG M·Filed 2007·Application pending·0 cites
- 1540US2004233067A1Acoustic siren detector systemFiled 2003·Application pending·0 cites
- 1637US7257197B2Reflector rack, fabrication method thereof, and narrow brand x-ray filter and system including sameMONOCHROMATIC X RAY FILTER TEC·Filed 2005·Granted Aug 14, 2007·0 cites·23 claims
- 1734US2007280421A1Narrow band x-ray system and fabrication method thereofCHO YONG M·Filed 2007·Application pending·0 cites
- 1832US2004247073A1High resolution X-ray systemFiled 2003·Application pending·0 cites
- 1932US2012082367A1Method of forming image of semiconductor device, and method of detecting a defect of the semiconductor device by using the image forming methodBYUN JUNG-HOON·Filed 2011·Application pending·0 cites
- 2031US2012155740A1Method of detecting defect in pattern and apparatus for performing the sameCHO YONG-MIN·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →