Inventor · disambiguated record
Yong-Gyu Chu
Also filed as: CHU YONG-GYU
17 granted patents·2 pending applications·134 citations·filing 1999–2021
92Inventor score
Top patents by PatentIndex Score
19 records- 0190US11036578B2Semiconductor memory devices and memory systems including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Jun 15, 2021·6 cites·19 claims
- 0285US11200117B2Semiconductor memory device, controller, memory system, and operation method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Dec 14, 2021·2 cites·20 claims
- 0384US6678206B2Semiconductor memory device including standby mode for reducing current consumption of delay locked loopSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Jan 13, 2004·31 cites·20 claims
- 0482US6285225B1Delay locked loop circuits and methods of operation thereofSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Sep 4, 2001·52 cites·20 claims
- 0572US7420871B2Synchronous semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Sep 2, 2008·8 cites·20 claims
- 0670US7221170B2Semiconductor test circuitSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted May 22, 2007·4 cites·9 claims
- 0764US11681579B2Semiconductor memory devices and memory systems including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Jun 20, 2023·0 cites·19 claims
- 0860US6909650B2Circuit and method for transforming data input/output format in parallel bit testSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jun 21, 2005·11 cites·7 claims
- 0955US6222411B1Integrated circuit devices having synchronized signal generators thereinSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Apr 24, 2001·16 cites·12 claims
- 1052US10824507B2Semiconductor memory device, controller, and memory systemSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Nov 3, 2020·0 cites·20 claims
- 1151US8315118B2Precharge method of semiconductor memory device and semiconductor memory device using the sameCHU YONG-GYU·Filed 2010·Granted Nov 20, 2012·2 cites·16 claims
- 1250US7433252B2Semiconductor memory device capable of storing data of various patterns and method of electrically testing the semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Oct 7, 2008·2 cites·12 claims
- 1348US9390772B2Semiconductor device including option pads for determining an operating structure thereof, and a system having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Jul 12, 2016·0 cites·6 claims
- 1446US10403331B2Semiconductor device having a floating option pad, and a method for manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Sep 3, 2019·0 cites·11 claims
- 1538US2008316846A1Semiconductor memory device capable of storing data of various patterns and method of electrically testing the semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2008·Application pending·0 cites
- 1637US7872932B2Method of precharging local input/output line and semiconductor memory device using the methodSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Jan 18, 2011·0 cites·18 claims
- 1735US7580294B2Semiconductor memory device comprising two rows of padsSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Aug 25, 2009·0 cites·20 claims
- 1830US2008170451A1Method and circuit for setting test mode of semiconductor memory deviceCHU YONG-GYU·Filed 2008·Application pending·0 cites
- 1927US7418638B2Semiconductor memory device and method for testing memory cells using several different test data patternsSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Aug 26, 2008·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →