Inventor · disambiguated record
Yoshinori Fujiwara
Also filed as: FUJIWARA YOSHINORI · FUJIWARA YOSHINORI S
52 granted patents·7 pending applications·216 citations·filing 1995–2025
98Inventor score
Files withMICRON TECHNOLOGY INC44FUJIWARA YOSHINORI4MITSUBISHI ELECTRIC CORP4BANDO CHEMICAL IND1FUJI TOOL CO LTD1
Top patents by PatentIndex Score
59 records- 0194US9666307B1Apparatuses and methods for flexible fuse transmissionMICRON TECHNOLOGY INC·Filed 2016·Granted May 30, 2017·15 cites·20 claims
- 0292US11183260B1Transmit line monitoring circuitry, and related methods, devices, and systemsMICRON TECHNOLOGY INC·Filed 2020·Granted Nov 23, 2021·4 cites·20 claims
- 0389US10593392B1Apparatuses and methods for multi-bank refresh timingMICRON TECHNOLOGY INC·Filed 2018·Granted Mar 17, 2020·8 cites·21 claims
- 0487US10056154B2Apparatuses and methods for flexible fuse transmissionMICRON TECHNOLOGY INC·Filed 2017·Granted Aug 21, 2018·6 cites·20 claims
- 0585US7885128B2Redundant memory array for replacing memory sections of main memoryMICRON TECHNOLOGY INC·Filed 2008·Granted Feb 8, 2011·11 cites·18 claims
- 0684US9824770B1Apparatuses and methods for flexible fuse transmissionMICRON TECHNOLOGY INC·Filed 2017·Granted Nov 21, 2017·5 cites·20 claims
- 0784US8230274B2JTAG controlled self-repair after packagingFUJIWARA YOSHINORI·Filed 2012·Granted Jul 24, 2012·7 cites·15 claims
- 0884US7612574B2Systems and methods for defect testing of externally accessible integrated circuit interconnectsMICRON TECHNOLOGY INC·Filed 2007·Granted Nov 3, 2009·12 cites·13 claims
- 0982US11727967B2Apparatuses and methods including dice latches in a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2022·Granted Aug 15, 2023·1 cites·10 claims
- 1082US6853177B2Semiconductor device with process monitor circuit and test method thereofRENESAS TECH CORP·Filed 2002·Granted Feb 8, 2005·33 cites·17 claims
- 1180US8159890B2Redundant memory array for replacing memory sections of main memoryFUJIWARA YOSHINORI·Filed 2011·Granted Apr 17, 2012·5 cites·20 claims
- 1280US2025021435A1Apparatuses, systems, and methods for error correctionLODESTAR LICENSING GROUP LLC·Filed 2024·Application pending·0 cites
- 1379US7721163B2JTAG controlled self-repair after packagingMICRON TECHNOLOGY INC·Filed 2007·Granted May 18, 2010·8 cites·29 claims
- 1477US11263078B2Apparatuses, systems, and methods for error correctionMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 1, 2022·1 cites·20 claims
- 1577US7831870B2JTAG controlled self-repair after packagingMICRON TECHNOLOGY INC·Filed 2010·Granted Nov 9, 2010·4 cites·20 claims
- 1673US12394456B2Apparatuses and methods including dice latches in a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2023·Granted Aug 19, 2025·0 cites·13 claims
- 1773US5611149AGage for use in weldingFUJI TOOL CO LTD·Filed 1995·Granted Mar 18, 1997·42 cites·17 claims
- 1872US7403444B2Selectable memory word line deactivationMICRON TECHNOLOGY INC·Filed 2007·Granted Jul 22, 2008·7 cites·15 claims
- 1971US12079076B2Apparatuses, systems, and methods for error correctionMICRON TECHNOLOGY INC·Filed 2022·Granted Sep 3, 2024·0 cites·15 claims
- 2069US11783909B2Systems and methods for power savings in row repaired memoryMICRON TECHNOLOGY INC·Filed 2022·Granted Oct 10, 2023·0 cites·20 claims
- 2169US8582377B2Redundant memory array for replacing memory sections of main memoryMICRON TECHNOLOGY INC·Filed 2013·Granted Nov 12, 2013·2 cites·20 claims
- 2269US8223583B2Row addressingNAKANISHI TAKUYA·Filed 2011·Granted Jul 17, 2012·3 cites·21 claims
- 2365US8122304B2JTAG controlled self-repair after packagingFUJIWARA YOSHINORI·Filed 2010·Granted Feb 21, 2012·2 cites·19 claims
- 2462US2025391493A1Apparatuses and methods for prioritized row redundancy regionsMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 2561US11417411B2Systems and methods for power savings in row repaired memoryMICRON TECHNOLOGY INC·Filed 2020·Granted Aug 16, 2022·0 cites·17 claims
- 2661US7990163B2Systems and methods for defect testing of externally accessible integrated circuit interconnectsMICRON TECHNOLOGY INC·Filed 2009·Granted Aug 2, 2011·3 cites·16 claims
- 2760US10923172B2Apparatuses and methods for multi-bank refresh timingMICRON TECHNOLOGY INC·Filed 2020·Granted Feb 16, 2021·0 cites·20 claims
- 2860US7933162B2Row addressingMICRON TECHNOLOGY INC·Filed 2008·Granted Apr 26, 2011·3 cites·15 claims
- 2959US11410742B1Microelectronic device testing, and related devices, systems, and methodsMICRON TECHNOLOGY INC·Filed 2021·Granted Aug 9, 2022·0 cites·20 claims
- 3057US11955160B2Asynchronous signal to command timing calibration for testing accuracyMICRON TECHNOLOGY INC·Filed 2022·Granted Apr 9, 2024·0 cites·20 claims
- 3157US6667915B2Semiconductor memory device having redundancy structure with defect relieving functionMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Dec 23, 2003·10 cites·6 claims
- 3257US2025336464A1Radiation monitoring using accumulated parity of non-protected latchesMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 3356US12394501B2Apparatus with adjustable diagnostic mechanism and methods for operating the sameMICRON TECHNOLOGY INC·Filed 2023·Granted Aug 19, 2025·0 cites·20 claims
- 3456US12100476B2Test mode security circuitMICRON TECHNOLOGY INC·Filed 2022·Granted Sep 24, 2024·0 cites·20 claims
- 3554US11742044B2Memory built-in self-test with adjustable pause timeMICRON TECHNOLOGY INC·Filed 2021·Granted Aug 29, 2023·0 cites·20 claims
- 3653US12100467B2Systems and methods for testing redundant fuse latches in a memory deviceMICRON TECHNOLOGY INC·Filed 2022·Granted Sep 24, 2024·0 cites·25 claims
- 3753US11342042B2Interconnected command/address resourcesMICRON TECHNOLOGY INC·Filed 2020·Granted May 24, 2022·0 cites·20 claims
- 3852US12061795B2Repair element availability communicationMICRON TECHNOLOGY INC·Filed 2021·Granted Aug 13, 2024·0 cites·37 claims
- 3950US11915775B2Apparatuses and methods for bad row modeMICRON TECHNOLOGY INC·Filed 2021·Granted Feb 27, 2024·0 cites·21 claims
- 4050US2025104792A1Apparatus including bti controllerMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 4148US11670356B2Apparatuses and methods for refresh address maskingMICRON TECHNOLOGY INC·Filed 2021·Granted Jun 6, 2023·0 cites·17 claims
- 4248US7000156B2Devices for storing and accumulating defect information, semiconductor device and device for testing the sameMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Feb 14, 2006·6 cites·10 claims
- 4348US5776395AMethod and apparatus for making a blade for electrophotographic devicesBANDO CHEMICAL IND·Filed 1996·Granted Jul 7, 1998·14 cites·6 claims
- 4447US11791011B1Self-repair verificationMICRON TECHNOLOGY INC·Filed 2022·Granted Oct 17, 2023·0 cites·25 claims
- 4546US6897415B2Workpiece stage of a resist curing deviceUSHIO ELECTRIC INC·Filed 2002·Granted May 24, 2005·3 cites·3 claims
- 4645US11081166B1Memory device random option inversionMICRON TECHNOLOGY INC·Filed 2020·Granted Aug 3, 2021·0 cites·20 claims
- 4744US10930327B1Memory read maskingMICRON TECHNOLOGY INC·Filed 2020·Granted Feb 23, 2021·0 cites·21 claims
- 4844US2024127901A1Temperature-based error masking during mbist operationMICRON TECHNOLOGY INC·Filed 2022·Application pending·0 cites
- 4943US11705214B2Apparatuses and methods for self-test mode abort circuitMICRON TECHNOLOGY INC·Filed 2020·Granted Jul 18, 2023·0 cites·15 claims
- 5043US11170837B1Identifying high impedance faults in a memory deviceMICRON TECHNOLOGY INC·Filed 2020·Granted Nov 9, 2021·0 cites·20 claims
Showing the top 50 of 59 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →